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TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Cases X,2 1/
2
3
4
6
8
9
10
12
13
14
16
18
19
20
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
Symbol
STD-883
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLK 1
K1
J1
PRE 1
Q1
GND
Q2
PRE 2
J2
K2
CLK 2
Q1
Q2
VCC
10
fMAX
Fig. 10
116-119
60
MHz
TC = +125C
8/
Fig. 9
120-121
2.0
11.0
ns
tPLH1
Fig. 10
122-123
"
"
"
tPLH2
Fig. 10
124-125
"
"
"
tPLH3
Fig. 9
126-127
"
"
"
tPHL1
Fig. 10
128-129
"
"
"
tPHL2
Same tests and terminal conditions as subgroup 9, except TC = +125C and limits are as shown.
Fig. 10
130-131
"
"
"
tPHL3
Fig. 11
132-135
9/
tSET(H)
Fig. 11
136-139
"
tSET(L)
t(HOLD)
Fig. 12
140-143
"
(L)
t(HOLD)
"
Fig. 12
144-147
(L)
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
1/ Cases X and 2 terminals not designated are NC.
2/ C = Normal clock pulse.
D = Momentary connection: 5.0 V to GND to 5.0 V before measurement is made (for subgroups 9, 10, 11, D occurs prior to other input pulses).
E = Normal input conditioning is 2.7 V, however, momentary logic "0" may be applied to input for synchronizing test equipment and for
preconditioning the device.
F = Momentary GND, then open.
3/ For circuit B, IIL4(min) is -0.7 mA.
4/ For circuit B, IOS(max) is 110 mA.
5/ Only a summary of attributes data is required.
6/ Inputs: A = 2.4 V minimum, B = 0.4 V.
7/ Outputs: H 1.5 V, L 1.5 V.
8/ fMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
9/ Monitor output to verify functionally with t(SET) and t(HOLD) limit conditions as shown on figures 11 and 12.

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