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Table 1. Electrical performance characteristics-cont. |
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|  MIL-M-38510/753B
TABLE I. Electrical performance characteristics - Continued.
3/
This test is guaranteed, if not tested, to the limits specified in table I.
RHA samples do not have to be tested at either -55C and +125C prior to irradiation.
4/
When performing postirradiation electrical measurements for any RHA level, TA = +25C. Limits shown are guaranteed at
5/
TA = +25C 5C.
6/
Transmission driving tests are performed at VCC = 5.5 V dc with a 2 ms duration maximum.
7/
Power dissipation capacitance (CPD) determines the no load dynamic power consumption,
PD = (CPD + CL) (VCC x VCC)f + (ICC x VCC) and the dynamic current consumption, IS = (CPD + CL)VCCf + ICC. For both CPD and
IS, f is the frequency of the input signal.
8/
This test is for qualification only. Ground bounce tests are performed on a nonswitching (quiescent) output and are used to
measure the magnitude of induced noise caused by other simultaneously switching outputs. The test is performed on a low
noise bench test fixture with all outputs fully dc loaded (IOL maximum and IOH maximum = i.e., 24 mA) and 50 pF of load
capacitance (see figure 3). The loads must be located as close as possible to the device output. Inputs are then
conditioned with 1 MHz pulse (tr = tf = 3.5 1.5 ns) switching simultaneously and in phase such that one output is forced low
and all others (possible) are switched. The low level ground bounce noise is measured at the quiet output using a F.E.T.
oscilloscope probe with at least 1 MΩ impedance. Measurement is taken from the peak of the largest positive pulse with
respect to the nominal low level output voltage (figure 3). The device inputs are then conditioned such that the output under
test is at a high nominal VOH level. The high level ground bounce measurement is then measured from nominal VOH level to
the largest negative peak. This procedure is repeated such that all outputs are tested at a high and low level with a
maximum number of outputs switching.
9/
When using in asynchronous TTL compatible systems, ground bounce (VGBL and VGBH) = 2000 mV can be a possible
problem.
10/ See EIA/JEDEC STD. No. 78 for electrically induced latch-up test methods and procedures. The values listed for Itrigger and
Vover are to be accurate within 5 percent.
11/ Tests shall be performed in sequence, attributes data only. Functional tests shall include the truth tables and other logic
patterns used for fault detection. Functional tests shall be performed in sequence as approved by the qualifying activity on
qualified devices. H ≥ 2.5 V, L < 2.5 V; high inputs = 3.7 V and low inputs = 0.6 V for VCC = 4.5 V and H ≥ 1.5 V,
L < 1.5 V; high inputs = 2.5 V and low inputs = 0.45 V for VCC = 3.0 V. Tests at VCC = 3.0 V are for RHA specified devices
only (TA = +25C 5C). Functional tests at VCC = 3.0 V are worst case for RHA specified devices.
12/ This test is required only for group A testing, see 4.4.1 herein.
13/ Device are tested at VCC = 3.0 V and VCC = 4.5 V at TC = +125C for sample testing and at VCC = 3.0 V and VCC = 4.5 V at
TC = +25C for screening. Other voltages of VCC and temperatures are guaranteed, if not tested. See 4.4.1d.
14/ AC limits at VCC = 5.5 V are equal to the limits at VCC = 4.5 V and guaranteed by testing at VCC = 4.5 V. Minimum ac limits
for VCC = 5.5 V are 1.0 ns and guaranteed by guardbanding the VCC = 4.5 V minimum limits to 1.5 ns. For propagation
delay tests, all paths must be tested.
11
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