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MIL-M-38510/757C
TABLE I. Electrical performance characteristics - Continued.
Test Conditions 1/
-55C TC +125C
Device type
Test and
Unit
VCC
Group A
Limits 1/
Symbol
+3.0 V VCC +5.5 V
2/
MIL-STD-883
subgroups
unless otherwise specified
test method
Min
Max
All
0.0 V
4
10
pF
Input capacitance
CIN
See 4.4.1c
TC = +25C
3012
03-11
5.5 V
4
15
pF
Output capacitance
COUT
See 4.4.1c
TC = +25C
3012
See 4.4.1c
Power dissipation
CPD
01, 02
50
5.0 V
4
pF
TC = +25C
capacitance
10/
03-11
65
All
4.5 V
4
0
2000
mV
Low level
VGBL
VLD = 2.5 V
IOL = +24 mA,
ground bounce
11/ 12/
see figure 3
noise
High level
VLD = 2.5 V
All
4.5 V
4
0
2000
mV
VGBH
IOH = -24 mA,
ground bounce
11/ 12/
see figure 3
noise
tw 100 s
Latch-up input/
All
5.5 V
2
200
mA
ICC
tcool tw
output over-
(O/V1)
5 s tr 5 ms
voltage
13/
5 s tf 5 ms
Vtest = 6.0 V
VCCQ = 5.5 V
Vover = 10.5 V
tw 100 s
Latch-up input/
ICC
All
5.5 V
2
200
mA
tcool tw
output positive
(O/I1+)
5 s tr 5 ms
over-current
13/
5 s tf 5 ms
Vtest = 6.0 V
VCCQ = 5.5 V
Itrigger = +120 mA
tw 100 s
All
5.5 V
2
200
mA
Latch-up input/
ICC
tcool tw
output negative
(O/I1-)
5 s tr 5 ms
over-current
13/
5 s tf 5 ms
Vtest = 6.0 V
VCCQ = 5.5 V
Itrigger = -120 mA
tw 100 s
Latch-up supply
ICC
All
5.5 V
2
100
mA
tcool tw
over-voltage
(O/V2)
5 s tr 5 ms
13/
5 s tf 5 ms
Vtest = 6.0 V
VCCQ = 5.5 V
Vover = 9.0 V
See footnotes at end of table.
10

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