TABLE III. Delta limits at 25°C.
ICCZ, ICCH, ICCL
1/ The above parameters shall be recorded before and
after the required burn-in and life tests to determine deltas (Ć).
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End-point electrical parameters shall be as specified in table II herein. Delta limits shall apply only to subgroup 1 of
group C inspection and shall consist of tests specified in table III herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified
in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be
maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance
with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point electrical
parameters shall be as specified in table II herein.
4.4.5 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness
assured (see 3.7 herein). RHA levels for device classes B and S shall be as specified in MIL-PRF-38535.
a. End-point electrical parameters shall be as specified in table II herein.
b. For device classes B and S, subgroups 1 and 2 in table V, method 5005 of MIL-STD-883 shall be tested as
appropriate for device construction.
c. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.
d. RHA tests for device classes B and S for levels M, D, P, L, R, and F shall be performed through each level to
determine at what levels the devices meet the RHA requirements. These RHA tests shall be performed for initial
qualification and after design or process changes which may affect the RHA performance of the devices.
e. Prior to irradiation, each selected sample shall be assembled in its qualified package. It shall pass the specified
group A electrical parameters in table I for subgroups specified in table II herein.
f. For device classes B and S, the devices shall be subjected to radiation hardness assured tests as specified in
MIL-PRF-38535 for the RHA level being tested. All device classes must meet the postirradiation end-point
electrical parameter limits as defined in table I at TA = +25°C ±5°C, after exposure, to the subgroups specified in
table II herein.