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|  MIL-M-38510/762A
4.4.5 Group E inspection. Group E inspection is required only for device types intended to be marked as radiation
hardness assured (see 3.5.2). RHA testing shall be performed in accordance with table V of method 5005 of MIL-STD-883
and electrical tests in table I herein. RHA quality conformance inspection sample tests shall be performed at the level specified
in the purchase order.
a.
RHA test for levels M, D, L, and R shall be performed through each level to determine at what levels the devices
meet the RHA requirements. These RHA tests shall be performed for initial qualification and after design or
process changes which may affect the RHA performance of the device.
b.
End-point electrical parameters shall be as specified in table I herein.
c.
Prior to total dose irradiation, each selected sample shall be assembled in its qualified package. It shall pass the
specified group A electrical parameters for subgroups specified in table II herein.
d.
The devices shall be subjected to radiation hardness assurance tests as specified in MIL-M-38510 for the RHA
level being tested, and meet the post irradiation end-point electrical parameter limits as defined in table I at
TA = +25 C + 5 C, after exposure.
e.
Prior to and during total dose irradiation characterization and testing, the devices for characterization shall be
biased so that 50 percent of the devices are tested at input high and 50 percent are at inputs low, and the devices
for testing shall be biased to the worst case condition established during characterization. Devices shall be biased
as follows:
(1) Inputs tested high, VCC = 5.5 V dc +5 percent, RCC = 10 + 5 percent, VIN = 5.0 V dc, +20 percent, RIN = 1
k +5 percent, and all outputs are open. The output enable control pin(s) shall be to RIN in parallel to VCC
or GND, as applicable, to enable the outputs.
(2) Inputs tested low, VCC = 5.5 V dc +5 percent, RCC = 10 + 5 percent, VIN = 0.0 V dc, and all outputs are open.
The output enable control pin(s) shall be connected to RIN in parallel to VCC or GND, as applicable, to enable
the outputs.
f.
Subgroups 1 and 2 of table V (method 5005) of MIL-STD-883 shall be tested as appropriate for device
construction.
4.5 Methods of inspection. Methods of inspection shall be specified as follows:
4.5.1 Voltage and current. Unless otherwise specified, all voltages given are referenced to the microcircuit GND terminal.
Currents given are conventional current and positive when flowing into the referenced terminal.
4.5.2. Burn-in and life test cool down procedures. When the burn-in and life tests are completed and prior to removal of bias
voltages, the devices under test (DUT) shall be cooled to within +10 C of their power stable condition at room temperature; then,
electrical parameter end-point measurements shall be performed.
4.5.3 Quiescent supply current. When performing quiescent supply current measurements (ICC), the meter shall be placed so
that all currents flow through the meter.
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