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TABLE III. Group A inspection for device type 08 Continued.
Terminal conditions (pins not designated may be H > 2.0 V, or L < 0.8 V, or open)
Cases
Test limits
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-
E,F
Measured
Symbol STD-883  X, 2 5/
Unit
Subgroup
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Min
Max
terminal
method
Test no.
1G
B
1C3
1C2
1C1
1C0
1Y
GND
2Y
2C0
2C1
2C2
2C3
A
2G
VCC
9
3003
91
GND
GND
GND
2.7 V
OUT
IN
5.0 V
1Y
2.0
20
ns
GND
tPLH2
"
Fig. 10
92
GND
IN
GND
2.7 V
OUT
"
GND
"
1Y
"
"
TC = +25C
"
93
GND
"
OUT
2.7 V
GND
IN
GND
"
"
"
"
2Y
"
94
IN
"
OUT
2.7 V
GND
GND
GND
"
2Y
"
"
"
"
95
IN
GND
"
"
"
1Y
"
23
"
2.7 V
OUT
tZH
"
96
"
"
"
"
IN
"
2Y
"
23
"
OUT
2.7 V
"
97
"
"
GND
OUT
"
"
"
1Y
"
24
"
tZL
"
98
"
"
"
OUT
GND
"
IN
"
2Y
"
24
"
"
99
"
"
2.7 V
OUT
"
"
"
1Y
"
13.5
"
tHZ
"
100
"
"
"
OUT
2.7 V
"
IN
"
2Y
"
13.5
"
"
101
"
"
GND
OUT
"
"
"
1Y
"
15.5
"
tLZ
"
102
"
"
"
OUT
GND
"
IN
"
2Y
"
15.5
"
Same tests and terminal conditions as subgroup 9, with limits as follows: tPHL1 = 14.5 ns, tPLH1 = 14.5 ns, tPHL2 = 26 ns, tPLH2 = 26 ns, tZH = 30 ns, tZL = 31 ns,
10
TC = +125C
tHZ = 18 ns, tLZ = 20 ns.
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
1/ A = 2.4 V; B = 0.4 V.
2/ H > 1.5 V; L < 1.5 V.
3/ Only a summary of attributes is required.
4/ For circuit B, IOS(max) = -110 mA.
5/ Case 2 pins not designated are NC.

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