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|  MIL-P-46530D(AR)
4.4 Quality Conformance Inspection.
4.4.1 Inspection lot formation. Inspection lots shall comply
with the lot formation provisions of MIL-A-48078.
See MIL-A-48078.
4.4.2 Examination.
a.
Unless otherwise specified in the Classification of
Defects and Test Tables, sampling plans for major and minor
defects shall be in accordance with MIL-STD-105, Inspection Level
II.
b. Major and Minor Defects. To determine product
acceptability, major and minor defects as listed herein may be
considered collectively on a class basis or defects may be
considered individually. When a class basis is utilized the
Acceptable Quality Level (AQL) for major defects shall be 1.50
percent and the AQL for minor defects shall be 2.50 percent.
However, when major defects are considered collectively on a class
basis, the AQL for any individual defect shall be limited to .40
In addition, where three or less defects appear in a
percent.
classification, sampling plans applicable to a class shall not be
used for major defects (see 6.6).
c. Critical Defects. Unless otherwise specified, one
hundred percent examination shall be performed for all critical
defects. If a visual critical defect is found in a sample either
just prior to a firing test or after a firing test (and the defect
is not due to the firing), the lot shall be rejected. The lot
shall then be screened and resubmitted for visual inspeciton of
critical defects. If a critical defect is found during packing,
the portion of the lot that has been packed or is in the process
of being packed shall be rejected. In addition the portion of the
lot remaining to be packed shall be rejected. The lot shall then
be screened and resubmitted for visual inspection of critical
defects.
d. MIL-STD-651 shall apply in defining and evaluating
visual defects.
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