 |
|||
|
Page Title:
Groups B and C life-test samples |
|
||
| ||||||||||
|
|  MIL-S-19500/37E
4.3.4 Groups B and C life-test samples. Sample units that have been subjected to the group B 340-hour life test
may be continued on test to 1,000 hours in order to satisfy group C life-test requirements. These sample units shall
be predesignated, and shall remain subjected to the group C 1,000-hour acceptance evaluation after they have
passed the group B 340-hour acceptance criteria. The cumulative total of failures found during the 340-hour test
and during the subsequent interval up to 1,000 hours shall be computed for the 1,000-hour acceptance criteria (see
4.3.3).
4.3.5 Representative lot (groups B and C inspections). At the option of the manufacturer, any of the types 2N333,
2N335, and 2N336 may be used for groups B and C inspections as representative of a lot containing the prototypes,
provided the type so selected is in the lot. Any of the types 2N333A, 2N335A, and 2N336A may be used for groups
B and C inspections as representative of a lot containing the "A" types, provided the type so selected is in the lot.
4.4 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.4.1 Resistance to solvents. Transistors shall be tested in accordance with method 215 of MIL-STD-202. The
following details shall apply:
a.
All areas of the transistor body where marking has been applied shall be brushed.
b.
After subjection to the tests, there shall be no evidence of mechanical damage to the device and markings
shall have remained legible.
6
|
|
Privacy Statement - Press Release - Copyright Information. - Contact Us |
Click
here for thousands of PDF manuals