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| MIL-T-81290(WP)
4.2.3 Warning to Contractor. Construction of the Missile Test Set in
accordance with drawings listed on BUWEPS LD 477269 shall not be construed
as a waiver of any of the requirements of this and other applicable specifi-
cations.
4.3 Tests
4.3.1 Operational Tests. Each Test Set delivered under contract shall
be subjected to the tests and examinations listed in OD 13776 Revision 1,
Change 3. Failure to meet any requirement specified herein shall be con-
sidered cause for rejection.
4.3.2 Test Conditions. Unless otherwise specified, the Test Set
shall be subjected to acceptance tests under the following conditions:
a.
Temperature - plus 65 to plus 95 degrees F.
Altitude - normal ground atmospheric pressure.
b.
c.
Humidity - room ambient to 95 percent relative.
do
Vibration - none
4.3.3 Test and Inspection Equipment and Facilities. The manufacturer
shall furnish and maintain all necessary test equipment, facilities and per-
sonnel for performing all acceptance tests. The test equipment shall be
adequate in quantity, and, unless definite requirements are specified, they
shall be of sufficient accuracy and quality to permit performance of the re-
quired acceptance tests.
4.3.4 Test Procedure. The Test Set shall meet the requirements of
3.3 when tested as specified in OD 13776 Revision 1, Change 3.
4.4 Preproduction and Periodic Production Tests. The preproduction
and periodic samples, after satisfactorily passing the quality conformance
inspections of OD 13776 Revision 1, Change 3, shall be subjected to the
additional quality conformance inspections (paragraphs 4.4.1 through 4.4.9).
Recalibration of the Test Set shall be permitted after having been subjected
to the tests of (4.4.1 through 4.4.9) and before being retested for the
quality conformance inspections of OD 13776 Revision 1, Change 3.
4.4.1 High Temperature. The Test Set, not energized, and with the
cover in place and latched, shall be placed within a suitable test chamber
and the chamber temperature raised to plus 160 plus 5 minus 0 degree F.
The chamber shall remain at this temperature for not less than eight hours
after which the temperature shall be lowered to plus 120 plus 5 minus 0 degrees
F, the cover removed and and temperature stabilized to 120 plus 5 minus 0
degrees F for six hours. The Test Set shall then be energized. The Test Set
shall meet all the performance and product characteristics of this specifica-
tion while maintained at the temperature of plus 120 plus 5 minus 0 degrees F.
13.
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