4.4.1 Examination of Product.
The Test Set shall be examined externally to
determine conformance to this specification with respect to materials,
workmanship and general requirements.
4.4.2 Continuity Test. A Continuity Test shall be conducted on each Test Set
to demonstrate compliance with the continuity requirements of AF Drawing No.
4.4.3 Insulation Test.
With the Test Set disconnected from the AN/PSM-6, a
megger with high potential of 500 volts minimum shall be applied as follows:
Between each connector pin and the connector shall.
Between each connector pin and every other connector pin.
Between each connector pin or shell and the Test Set case.
The insulation resistance in each instance shall be 100 megohms
4.4.4 Environmental Sampling Test.
During the course of production, Test
Sets shall be subject to the Vibration Test, Method 514.1, Procedure XI of
126.96.36.199 Sampling Procedure.
Sampling Procedures provided by MIL-STD-105 for
Special Inspection Level S-3, Single Sampling, Normal Inspection, Acceptable
Quality Level (AQL) Value of 4.0 for Major Defects. An Insulation Test
(4.4.3) shall be performed before the start of and after completion of each of
the Environmental Sampling Tests (4.4.4).
188.8.131.52 Inspection Lot.
An Inspection Lot shall consist of a maximum of one
month's production but not less that 25 Test Sets.
184.108.40.206 Unit of Product and Sample Selection.
The unit of product for
sampling purposes shall be one complete Test Set.
Samples shall be selected
in a random manner from the production lot.
The lot identity shall be
maintained during performance of this test, and no units from the lot shall be
supplied prior to determination of acceptability of the sample.
220.127.116.11 Defect Classification.
All defects resulting from the specified
functional or mechanical requirements as a result of the vibration test shall
be classified as major.
Each unit which fails to meet one or more of the
specified tests shall be deemed to be one major defect.
PREPARATION FOR DELIVERY
5.1.1 Level A.
Each Test Set shall be packaged in accordance with Method IIb