corrective action shall be taken to eliminate this defect from future test
sets. The 6 hour period specified above may be made up of several shorter
periods to conform to normal working hours (see 6.2.2).
184.108.40.206 Temperature tests. Temperature tests shall be performed on the
number of test sets specif ied in table II of electronics assembly (1098ASI3OO)
at -40 and +55° C following the manufacturing run-in tests as follows:
Soak periods shall be 1 hour at -40 or at +55° C as applicable with
test set unenergized.
A dc power supply capable of supplying 200 MA, 9.9 to 14.5 volts with
1 mv maximum ripple shall be substituted for the battery pack.
The battery test subsystem requirements (see 220.127.116.11.4.2) shall be
verified with supply voltage at 11.25 ± .05 volts and at 11.60 ± .05
The command subsystem requirements (see 18.104.22.168.1) and detector
subsystem requirements (see 22.214.171.124.2 and 126.96.36.199.3) shall be veri-
fied with supply voltage at 11.60 ± .05 and at 14.25 ± .05 volts.
The self test subsystem (see 188.8.131.52.4) shall be verified at 11.60 ±
Following satisfactory conclusion of the temperature tests, the opera-
tional test shall again be performed at room ambient conditions
using battery pack 178AS200.
Sampling test sample selection
4.4.6 Scope of tests. As a minimum, each test set selected for sampling
tests shall be subjected to the following:
Complete operations test at ambient room conditions, making all
necessary measurements to assure that all applicable specification
requirements have been met.