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Page Title:
Determination of defect or failure |
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|  MIL-V-82443(OS)
Low temperature operating. The valve shall be subjected to
4.6.3.9
the low temperature operating test in accordance with 4.4.4.8.
High temperature operating. The valve shall be subjected
4.6.3.10
to the high temperature operating test in accordance with 4.4.4.9.
Firing current. The valve shall be subjected to the firing
4.6.3.11
current test in accordance with 4.4.4.13.
4.6.3.12
Leakage at operating pressure, normally closed outlet port,
after firing. The valve shall be subjected to the post firing leakage
test (closed outlet) in accordance with 4.4.4.16.
Leakage at operating pressure, inlet and outlet ports, after
4.6.3.13
firing. The valve shall be subjected to the post firing leakage test
(inlet and outlet ports) in accordance with 4.4.4.17.
Ram operation. The valve shall be subjected to the ram
4.6.3.14
operation test in accordance with 4.4.4.15.
Visual inspection after firing. The valve, after firing, shall
4.6.3.15
be subjected to visual inspection in accordance with 4.4.4.14.
4.6.4
Test data. Test data shall be recorded in accordance with
4.4.5, as appropriate, and maintained as part of the inspection record.
3.6.5
Determination of defect or failure. Failure of the valve
to successfully pass the tests in 4.6.3.1 through 4,6.3.15 shall be
cause for withholding acceptance of all units on hand. Corrective action Corrective action
shall be taken in accordance with 4.3.3.
5.
PREPARATION FOR DELIVERY
4.1
The valve shall be packed and packaged in accordance with
instructions listed on BuWeps DL 1330498.
5.2
Marking.
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