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Page Title:
Appendix Procedure for Qualification Inspection |
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|  MIL-C-11015E
APPENDIX
PROCEDURE FOR QUALIFICATION INSPECTION
10. SCOPE
10.1 This appendix details the procedure for submission of samples, with related data, for qualification inspection
of capacitors covered by this specification. The procedure for extending qualification of the required sample to other
capacitors covered by this specification is also outlined herein. This appendix is a mandatory part of this
specification. The information contained herein is intended for compliance.
20. APPLICABLE DOCUMENTS. This section is not applicable to this appendix.
30. SUBMISSION
30.1 Sample.
30.1.1 Single-style submission. A sample consisting of 51 sample units (63 sample units are required for styles
CK05 and CK06) of the highest capacitance value in each voltage rating, in each rated temperature and voltage-
temperature limits, in each style for which qualification is sought shall be submitted.
30.1.2 Combined-voltage submission (styles CK60, CK63, and CK70). A sample consisting of 26 sample units of
the highest capacitance value in each voltage rating, in each rated temperature and voltage-temperature limits, in
each style for which qualification is sought shall be submitted (see table X).
TABLE X. Combined-voltage submission.
Style
No. of sample
Type
Rated
units to submitted
designation
voltage
26
CK60AW152M
500
26
CK60AW102M
1,000
CK60
26
CK60AX471K
500
26
CK60AX221K
1,000
26
CK60BX151K
500
26
CK60BX101K
1,000
CK63
26
CK63AW103M
500
26
CK63AW472M
1,000
CK70
26
CK70AX681K
500
26
CK70AX101K
1,000
30.1.3 Group submission. A sample consisting of the number of sample units with type designations as shown in
table XI shall be submitted. Failure of one style in a group will fail the complete group.
30.2 Test data. When examinations and tests are to be performed at a Government laboratory, prior to
submission all sample units shall be subjected to all of the examinations and tests indicated as nondestructive in
table IV. Each submission shall be accompanied by the test data obtained from these examinations and tests. The
performance of the destructive tests by the supplier on a duplicate set of sample units is encouraged, although not
required. All test data shall be submitted in duplicate.
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