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MIL-C-18312F
4.6 Conformance inspection.
4.6.1 Inspection of product for delivery. Inspection of product for delivery shall consist of group A inspection.
Except as specified in 4.6.2.3, delivery of products that have passed the group A inspection shall not be delayed
pending results of the group B inspection.
4.6.1.1 Inspection lot. An inspection lot shall consist of all capacitors of the same group and of the same
characteristic (see 1.2.1.4), produced under essentially the same conditions and offered for inspection at one time.
The sample selected from the lot shall be representative of the styles in the lot. All styles and voltage ratings may be
combined by characteristic as indicated in table VI.
TABLE VI. Inspection lot groups.
Group
Characteristic symbol
1
R
2
N
4.6.1.2 Group A inspection. Group A inspection shall consist of the examinations and tests specified in
table VII in the order shown.
4.6.1.2.1 Sampling plan. The sampling plan shall be as specified in table VII. In the event of one or more
failures, the lot shall be rejected.
4.6.1.2.2 Rejected lots. If an inspection lot is rejected, the supplier may rework it to correct the defects, or screen
out the defective units, and resubmit for reinspection. Reinspected lots shall be kept separate from new lots, and
shall be clearly identified as reinspected lots.
TABLE VII. Group A inspection.
Examination or test
Requirement
Method
Sampling
paragraph
paragraph
procedure
Subgroup 1
Seal
3.5
4.7.2
Dielectric withstanding voltage
3.6
4.7.3
Insulation resistance at 25C
3.9
4.7.6
See table VIII
0 failures
Capacitance
3.7
4.7.4
Dissipation factor
3.8
4.7.5
Subgroup 2
Visual and mechanical examination
Physical dimensions
3.1, 3.3, 3.4
4.7.1
13 samples
0 failures
Marking 1/
3.21
4.7.1
Workmanship
3.23
4.7.1
Subgroup 3
Insulation resistance (at high ambient)
3.9
4.7.6
See table IX
0 failures
Life
3.19
4.7.16.2
1/ Marking defects are based on visual examination and will be charged only for illegible,
incomplete, or incorrect marking. Any subsequent electrical defects shall not be used
as a basis for determining marking defects.
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