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|  MIL-C-51475(EA)
4.4.2 Sampling. Sampling shall be conducted in accordance with
MIL-STD-105.
4.4.3 Inspection procedure.
4.4.3.1 Examination. Sample carrier assembly components shall be
examined in accordance with the classification of defects and with
MIL-STD-105.
4.4.3.2 Classification of defects.
(a) Case inseparable assembly (Drawing D122-3-59).
Categories
Defects
Critical:
None defined
Major:
AQL 1.0 percent defective
101
Component missing
102
Component incorrectly assembled
(b) Ejector, projectile (Drawing C122.3-41).
Categories
Defects
Critical:
None defined
Major:
AQL 1.5 percent defective
101
Projectile interface OD incorrect
102
Location of flange incorrect
103
Profile of flange incorrect
104
Diameter of flange incorrect
105
Internal tapers incorrect
106
External tapers incorrect
(c) Holder, projectile (Drawing C122-3-42).
Categories
Defects
Critical:
None defined
Major:
AQL 1.5 percent defective
101
ID of
projectile interface incorrect
102
OD of
bead incorrect
103
Slots
incorrect or incorrectly located
104
ID of
ejector interface incorrect
4
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