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|  QUALITY CONFORMANCE INSPECTION
MIL-C-64025(AR)
CLASSIFICATION OF DEFECTS & TESTS
NUMBER
PARAGRAPH
TITLE
DRAWING
4.4.2.3
Microcircuit, CMOS Monlithic
1
1
See Below
SHEET
OF
NEXT HIGHER ASSEMBLY
9333595
NO. OF
AQL
SAMPLE
EXAMINATION OR TEST
CATEGORY
REQUIREMENT
PARAGRAPH REFERENCE
100%
UNITS
PARAGRAPH
/lNSPECTION METHOD
P
tN
b
9333701 933702
None defined
Critical
Major
101
Screening not performed
100%
MIL-STD-883,
Method 5004, Class
B/Certification
102
Conformance testing
MIL-STD-883, Method
1
5005, Class B/
Certification
Minor
201
Marking incorrect
0.65%
Visual
202
Poor workmanship
0.65%
Visual
NOTES Sampling plan shall be per applicable paragraphs of MIL-M-3851O, Appendix B.
--
R
used.
ces DRSMC-QA (D) Form 160, 1 Aug 83, which may no
Form 1570, 1 Feb 85
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