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|  QUALITY CONFORMANCE INSPECTION
MIL-C-64025(AR)
CLASSIFICATION OF DEFECTS & TESTS
TITLE
PARAGRAPH
DRAWING NUMBER
Transistor Array, Field Effect
4.4.2.27
1
1
9333022
SHEET OF
NEXT HIGHER
ASSEMBLY
9333746
NO. OF
AQL
CATEGORY
EXAMINATION OR TEST
SAMPLE
PARAGRAPH REFERENCE
REQUIREMENT
UNITS
100%
PARAGRAPH
/lNSPECTION METHOD
None defined
Critical
Major
101
Gate threshold voltage incorrect
MIL-STD-750,
Method 3403
102
Drain-source on voltage incorrect
MIL-STD-750 ,
Method 3405
103
Drain-source breakdown incorrect
MIL-STD-750,
Method 3407
104
On-state drain current incorrect
MIL-STD-750,
Method 3413
105
Solderability
MIL-STD-202,
Method 208
Except aging
Minor
201
Poor workmanship
0.65%
Visual
Rep
es DRSMC-QA (D) Form 160, 1 Aug 83, which may not
Form 1570, 1 Feb 85
AM
*
q
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