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|  QUALITY CONFORMANCE INSPECTION
MIL-C-64025(AR)
CLASSIFICATION OF DEFECTS & TESTS
TITLE
NUMBER
DRAWING
PARAGRAPH
Transistor, PNP (JAN2N869A)
1 OF 1
MIL-S-19500/283
4.4.2.71
SHEET
NEXT HIGHER ASSEMBLY
9333746
NO. OF
AQL
SAMPLE
OR
PARAGRAPH REFERENCE
EXAMINATION OR TEST
REQUIREMENT
CATEGORY
.
100%
PARAGRAPH
UNITS
/INSPECTION METHOD
None defined
Critical
Major
3.2
101
Wire material incorrect
32
Note 1
Visual
102
Wire bond
32
3.2
Note 1
Pull Tester (Note 2)
MIL-S-19500/283 compliance
103
3.2
Certification
104
Solderability (3" leads)
0.40%
MIL-STD-202,
3.5.1
Method 208
105
Leakage current ice
3.2
0.40%
MIL-STD-750,
Method 3041, Cond. B
106
Internal visual
Note 3 LTPD 10% 3.2
MIL-STD-750,
Method 2072, Para 3.2
only
Minor
201
Poor workmanship
3.20
Visual
O. 65%
.
(1) Reject for three (3) or more defects.
(2) Pull all wire.
(3)
Sampling
per
MIL-M-3851O, Appendix B.
Rep
e s DRSMC-QA (D) Form 160. 1
AMSMC
A U g 83, which may not
Form 1570, 1 Feb 85
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