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Page Title:
Diode, Silicon, Switching Type (JAN1N5712) |
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|  QUALITY
CONFORMANCE
INSPECTION
CLASSIFICATION OF DEFECTS & TESTS
TITLE
PARAGRAPH
DRAWING NUMBER
4.4.2.78
Diode, Silicon, Switching Type (JAN1N5712)
11
MIL-S19500/445
SHEET
OF
NEXT HIGHER ASSEMBLY
9333746/9333560
NO. OF
AQL
EXAMINATION OR TEST
CATEGORY
q ARAGRAPH REFERENCE
SAMPLE
REQUIREMENT
100%
UNITS
PARAGRAPH
/lNSPECTION METHOD
None defined
Critical
Major
101
Forward voltage drop
0.40%
3.2
MIL-STD-750,
Method 4011
102
Reverse leakage current
MIL-STD-750 ,
0.40%
3.2
Method 4016
103
MIL-S-19500/445 compliance
3.2
Certification
104
Solderability (all leads)
0.40%
3.5.1
MIL-STD-202 ,
Method 208
JAN marking missing
105
3.2
Visual
Minor
201
Poor workmanship
0.65%
3.20
Visual
Replaces DRSMC-QA (D) Form 160, 1 Aug 83,
AMSMC Form 1570, 1 Feb 85
which may not be u s e d .
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