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Page Title:
Semiconductor Device, Diode (JANlN5711) |
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|  QUALITY
CONFORMANCE
INSPECTION
CLASSIFICATION OF DEFECTS & TESTS
DRAWING NUMBER
mu
PARAGRAPH
Semiconductor Device, Diode (JANlN5711)
I OF 1
MIL-S-19500/444
4.4.2.82
SHEET
NEXT HIGHER ASSEMBLY
9333580
NO. OF
AQL
SAMPLE
REQUIREMENT
PARAGRAPH REFERENCE
EXAMINATION OR TEST
CATEGORY
100%
PARAGRAPH
UNITS
/lNSPECTION METHOD
None defined
Critical
Major
Forward voltage drop
o. 40%
3.2
MIL-STD-750 ,
101
Method 4011
102
Reverse leakage current
0.40%
3.2
MIL-STD-750 ,
Method 4016
103
MIL-S-19500/444 compliance
3.2
Certification
0.40%
3.5.1
MIL-STD-202,
104
Solderability (all leads)
Method 208
JAN marking missing
Visual
105
3.2
Minor
3.20
Visual
Poor workmanship
0.65%
201
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