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|  MIL-C-70491(AR)
4.5.2.3,2 Fabrication, setup and calibration
Design and
fabrication of test equipment shall be such that it incorporates
the features of rigidity, stability, and ease of maintenance.
Setup and calibration equipment necessary for certification of the
testing equipment accuracy shall be furnished and will become a
part of the testing equipment. Operating and calibration
instruction shall be prepared and submitted to the procuring
activity.
4.6 Test methods and procedures. Unless otherwise specified
in the contract, the following procedures shall be utilized to
conduct specified test. If the contractor chooses to use
alternate test procedures, a detailed description of the set-up and
procedure shall be submitted to the government procuring agency for
approval prior to use.
4.6.1 ESS temperature. Testing equipment utilized in this
test shall conform to the requirements of 4.5.2.3.1. The
display/processor circuit card assembly shall be placed in the test
o
0
chamber and the temperature of the chamber reduced 10 C (18 F)
o
0
per minute plus or minus l C (1.8 F) from room ambient
0
temperature (as specified in 3.3.1) to -57 C (-71F). The
assembly shall be maintained at this temperature for a minimum of
20 minutes. Upon completion of the 20 minute exposure, the
temperature of the chamber shall be raised 10C (18F) per
minute plus or minus 1C (1.8F) to +71F (+160C). The
assembly shall remain at this temperature for a minimum of 20
minute Upon completion of the 20 minute exposure the temperature
of the chamber shall be reduced 10C (18F) per minute plus or
minus lC (1.8F) to room ambient temperature (as specified in
3.3.1). The above procedure shall be conducted a minimum of ten
times. Upon completion of the cycles the assembly shall then be
removed from the chamber and subjected to the test in 4.6.3. It
shall meet the requirements of 3.2.1.1.
4.6.2 ESS vibration. Conduct the vibration test with the
display/processor circuit card assembly positioned on an
appropriate adapter affixed to a vibrating machine that is capable
of providing the amplitudes and frequencies specified in 3.3.3.
Unless otherwise specified, the test equipment shall be in
accordance with the "Test Facilities" requirements of MIL-F-13926.
The applied motion shall be in two separate planes for the time
period specified. Upon completion of the vibration sweep the
assembly shall be removed from the vibration adapter and shall be
subjected to the test in 4.6.3.
It shall meet the requirements of
3.2.1.1.
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