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Page Title:
Table III. Classification of defects. |
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|  MIL-C-70492(AR)
One modem circuit card assembly
4.4.2 Special sampling.
shall be selected at random as a special sample from each lot or
each 100 produced which ever occurs first. The sample shall meet
the requirements and tests in Table III.
Classification of defects.
TABLE XII.
Test Procedure
Requirement
No,
Characteristics
Applicable Drawing/
3.4
201.
Fabrication
Visual
Applicable Drawing/
3.7
Materials
202.
Visual
The tests in Table III shall be conducted at room ambient
NOTE:
temperature (as specified in 3.3.1).
Should any one item of a special
4.4.3 Failure of sample.
sampling fail to meet the specified test requirements acceptance
of the represented inspection lot will be suspended by the
Government until necessary corrections have been made by the
contractor and resubmitted items have been approved in accordance
with "Acceptance and Rejection" as specified in MIL-STD-105.
4.5 Inspection equipment. Except as otherwise provided for
by the contract, the contractor shall supply and maintain
inspection equipment in accordance with the applicable
requirements of MIL-I-45607.
4.5.1 Government furnished inspection equipment. Where the
contract provides for Government furnished test equipment supply
and maintenance of test equipment shall be in accordance with the
applicable requirements specified in MIL-I-45607.
4.5.2 contractor furnished inspection equipment.
4.5.2.1 Government desiqn. All inspection equipment
specified by drawing number in specification or QAP forming a part
of the contract shall be supplied by the contractor in accordance
with technical data included in the Technical Data package List
(TDPL).
In the absence of Government
4.5.2.2 Contractor design.
inspection equipment designr the contractor shall design and
supply inspection equipment compatible with the "Test Methods and
Procedures" specified in 4.6 of this specification and with the
component inspection procedures specified in "Examination" and
"Test Facilities" requirements of MIL-F-13926. Since tolerance of
test equipment is normally considered to be within 10% of the
product tolerance for which it is intended, this inherent error in
the test equipment design must be considered as part of the
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