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|  MIL-C-70784 (AR)
MIL-STD-651
4.3.2 Examination for defects. See MIL-A-48078.
shall apply in defining and evaluating cartridge visual defects as
applicable.
Unless otherwise specified, one
a. Critical defects.
hundred percent examination shall be performed for all critical
If a visual critical defects is found in a sample either
defects.
just prior to a firing test or after a firing test (and the
The
defects is not due to the firing), the lot shall be rejected.
lot shall then be rescreened and resubmitted for visual inspection
of critical defects. If a critical defects is found during
packing, the portion of the lot remaining to be packed shall be
rejected. The lot shall then be rescreened and resubmitted for
visual inspection of critical defects.
b. Major and minor defects. Major and minor defects
shall be performed on a class basis in accordance with
classification of defects using applicable sampling plans and
acceptance criteria of MIL-STD-105. All nonconforming cartridges
shall be rejected. The following AQL's are assigned to major and
minor defects:
Major . ...... . ....... . ....... 0.25%
Minor . . . . . . . . . . . . . . . . . . . . . . . 0.40%
The classification of
4.3.3 Classification of defects.
defects shall be as follows:
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