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|  MIL-E-48630(AR)
4.5 Test methods and procedures. Only Government approved test
equipment and test fixtures shall be connected to electronics
assemblies (electronic assembly) under test to verify that it
complies with the requirements specified herein. Increasing the PTB
oscillator frequency to reduce test time is acceptable, provided the
higher frequency used does not cause or mask malfunctions in the
functional operation of the electronic assembly; the frequency used
is within the capability of the test equipment to monitor response
with the required accuracy; and the actual procedure used to
increase the frequency of the signal is approved by the Government
before it is implemented. When the PTB oscillator frequency is
increased, the TTB oscillator frequency is to be proportionately
increased or the TTB oscillator inhibited as applicable for the test
being implemented. All testing shall be performed, unless otherwise
specified, at a supply voltage of 7.0 0.15 volts, an ambient
temperature of 75F 10F, and a relative humidity of 60
20%. Also, the rise time of the supply voltage applied to the
electronic assembly under test shall not be less than 5 milliseconds
nor greater than 200 milliseconds. All tests are nondestructive
unless otherwise noted.
4.5.1 Quiescent current test. With the electronic assembly
under test connected to the test fixture and with the detonator
connected through a 3.9 5% ohm resistor,
and
terminal
measure the quiescent current of the electronic assembly. The
measured current shall be observed for compliance with the
requirement specified in 3.5.1. This is a non-destructive test.
4.5.2 Primary time base (PTB) period test. With the electronic
assembly under test connected to the test fixture and with both the
primary and test time base circuits oscillating at their natural
frequency, measure the period of the PTB oscillator at test point
T.P.4. Observe the measured period for compliance with the
requirements specified in 3.5.2.1 for the corresponding temperatures
and voltages under which this test is conducted. This is a
non-destructive test.
4.5.3 Test time base (TTB) period test. With the electronic
assembly under test connected to the test fixture and with both the
primary and test time base oscillators operating at their natural
frequency, measure the period of the TTB oscillator at test point
T.P.5. Observe the measured period for compliance with the
requirements specified in 3.5.2.1 for the corresponding temperatures
and voltages under which this test is conducted. This is a
non-destructive test.
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