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| MIL-E-63300A(AR)
procedure used to increase the frequency of the signal is approved
by the government before it is implemented. When the PTB oscillator
frequency is increased, the TTB oscillator frequency is to be
proportionately increased or the TTB oscillator inhibited as
applicable for the test being implemented. All testing shall be
performed, unless otherwise specified at a supply voltage of 6.50
0.10 volts, an ambient temperature of 25 5C, and a relative
humidity of 60 + 20%.
4.5.1 Quiescent current test. With the electronic assembly
under test connected to the test fixture; the tripline-sensor
interface circuit test points TP22, TP23, TP24 and TP25 connected to
the ground; the piston actuator terminal (E33), the pressure
cartridge terminal (E32), and the detonator terminal (E30) each
connected to the ground through a 10 ohm resistor, measure the
quiescent current of the electronic assembly. Observation shall be
made for compliance with the requirement specified in 3.4.1. This
is a non-destructive test.
4.5.2 Primary Time Base (PTB) period test,- With the electronic
assembly under test connected to the test fixture and with both the
primary and test time base circuits oscillating at their natural
frequency, measure the period of the PTB oscillator at test point
TP32 . Observation shall be made for compliance with the applicable
requirement, 3.4.2.1. This is a non-destructive test.
4.5.3 Test Time Base (TTB) period test.- With the electronic
assembly under test connected to the test fixture and with both the
primary and test time base oscillators operating at their natural
frequency, measure the period of the TTB oscillator at test point
TP35. Observation shall be made for compliance with the applicable
r e q u i r e m e n t , 3.4.2.2.
This is a non-destructive test.
4.5.4 S&A assembly arm signal test.
With the electronic
assembly under test connected to the test
fixture, verify that the
S&A assembly arm signal occurs at the PTB
clock count specified in
Table I of Drawing 9292960 (See 3.4.2.3).
This is a non-destructive
test.
4.5.5 Pressure cartridge signal test.
With the electronic
assembly under test connected to the test fixture, verify that the
pressure cartridge signal occurs at the PTB clock count specified in
Table I of Drawing 9292960 (See 3.4.2.4). This is a non-destructive
test.
4.5.6 Electronic arm test.
With the electronic assembly under
test connected to the test fixture, verify that electronic arming
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