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MIL-F-48235 (MU)
4.3.3 Testing
4.3.3.1 Functioning (see 3.5)
4.3.3.1.1 Ambient temperature (see 3.5.1). - This test shall
be performed 100 percent.  Any firing device which fails to comply
with the requirements listed in Table I shall be classed defective
and removed from the lot.  The test shall be performed as speci-
fied in 4.4.3 using test equipment in accordance with 4.3.4.
(Non-Destructive)
TABLE I
Note 1 - Duration of energy pulse to be tested in accordance
with 4.3, 3.1.3 at ambient temperature only.
4.3.3.1.2 Cold temperature (see 3.5.2). - Twenty (20) firing
devices shall be selected from each lot for test.  The lot shall
20

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