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Page Title:
Table 10. Group A Final Static High Temperature Electrical Parameters |
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|  MIL-F-48267 (PA)
4.3.3.7 Group A Final Static High Temperature Electrical
Parameters (see 3.10) Major Defects. - Each lot of IC'S shall
be tested 100 percent after passing the ambient electrical tests
for the requirements listed in Table No. 10 in sequential order and
in accordance with 4.4.7. Any IC classed defective shall be re-
moved from the lot.
4.3.3.8 Group A Final Static Low Temperature Electrical
Parameters (see 3.11) Major Defects. - Each lot of IC'S shall be
tested 100 percent after passing the high temperature electrical
tests for the requirements of Table No. 11 in sequential order
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