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| MIL-F-48673 (AR)
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Required Data Pattern
Test Set TP
Scope Chan.
UIEQ
Table VI
B08
1
LRF
Complement of LRF
D09
2
LF2F
Record the results in data sheet.
401
TEST SELECT Setting:
d.
Required Data Pattern
Test Set TP
Scope Chan.
Signal
Table VI
A12
1
EASM
Complement of EASM
BO1
2
EAS MA
Record the results in data sheet.
400
TEST SELECT Setting:
e.
..
Required Data Pattern
Test Set TP
Scope Chan.
Signal
20 microsec logic "O" ,
B08
1
LRF
every 100
+
1 0%
Complement of LRF
B09
2
LRF
Record the results in data sheet.
Memory control test.
4.6.11
4.6.11.1 Waveform test. Set the TEST SELECT thumbwheel
switches as specified below. Utilizing the oscilloscope,us~ in
tests per paragraph 4.5.1.4.7 (set-up as specified therein except
as changed in this paragraph) and connected to the stipulated TEST
POINTS, observe the required waveforms.
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