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|  MIL-H-48408A(MU)
4.6.2.2 Operational temperatures - The test shall be performed in
accordance with Procedure I of MIL-F-13926 at the extreme temperatures
specified in 3.3.2.2 utilizing the testing equipment indicated in 4.6.2.1.
The assembly shall be exposed to each specified temperature for a period
of two hours. At the end of each two hour period, and while still at the
specified temperature, the assembly shall be subjected to the tests in
4.6.3. The assembly shall conform to the requirements of 3.3.2.2, 3.3.3.
4.6.2.3 Vibration.- This test shall be performed as per MIL-STD-810,
Method 514.2, Procedure VIII, Curve V, Figure 514.2-6, resonance dwell not
required. Subsequent to the vibration test the module shall meet the re-
quirements of 3.3.3.
4.6.2.4 Shock. - This test shall be performed as per MIL-STD-81O,
Method 516.2, Procedure I, Figure 516.2-1, Note 1. Subsequent to the
shock test the module shall meet the requirements of 3.3.3.
4.6.2.5 Humidity. - This test shall be performed as per MIL-STD-810,
Method 507.1, Procedure IV, Figure 507.1-3. Subsequent to the humidity
test the module shall meet the requirements of 3.3.3.
4.6.2.6 Fungus. - This test shall be performed as per MIL-STD-81O,
Method 508.1, Procedure I. Subsequent to the fungus exposure the module
shall meet the requirements of 3.3.3.
4.6.2.3 Performance - Operation.- Perform the tests 4.6.3.1 through
4.6.3.4 utilizing standard test equipment. When tested outside of the
M55 LASER Trainer, the power supply shall always be mounted on a radiat-
ing type heat sink made of high thermal conductivity material of 1/4 inch
thickness minimum, and whose minimum dimensions shall be five inches by
two inches by one inch.
4.6.3.1 No load voltage. - Perform this test supplying the voltages
as specified in 3.3.3.1 and measuring the output voltages using standard
test equipment to conform to the requirements of 3.3.3.1.
4.6.3.2 Full load current.- Perform this test supplying the voltages
specified in 3.3.3.2, and measuring the output current using standard test
equipment to conform to requirements of 3.3.3.2.
4.6.3.3 Inhibit voltage test.- Perform this test supplying the volt-
ages as specified in 3.3.3.3 and measuring the output voltages using stan-
dard test equipment to conform to the requirements of 3.3.3.3.
4.6.3.4 Flash mode test.- Perform this test supplying the voltages
as specified in 3.3.3.4 and measuring the output voltages pulses, as
shown in Figure I and Figure II using standard test equipment to conform
to the requirements of 3.3.3.4.
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