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|  MIL-I-19028E(OS)
3.3.1.6.1.1.1 Within 3 hours of completion of the temperature and
humidity nonoperating test, the insulation resistance shall be 1
megohm minimum.
3.3.1.6.1.1.2 Within 48 hours of completion of the temperature
and humidity nonoperating test, the insulation resistance shall be
100 megohms minimum.
3.3.1.6.1.1.3 On completion of high temperature operating test
and while still at the operating temperature, the insulation resistance
shall be 20 megohms minimum.
3.3.1.6.1.1.4 On completion of high temperature operating test and
within 1 hour of returning to ambient temperature, the insulation
resistance shall be 100 megohms minimum.
3.3.1.6.2 AC circuits. All ac circuits of the inverter must be
capable of withstanding 1250 volts rms, 60 Hz to the frame, with the
dc circuit grounded to the frame, for a period of at least 1 minute
without any arcing or breakdown of insulation.
3.3.1.6.2.1 The insulation resistance at 500 volts dc shall be 100
megohms minimum between all inverter ac circuits and the frame, with
all dc circuits grounded to the frame.
3.3.1.6.2.1.1 Within 3 hours of completion of the temperature and
humidity nonoperating test, the insulation resistance shall be 1
megohm minimum.
3.3.1.6.2.1.2 Within 48 hours of completion of the temperature and
humidity nonoperating test, the insulation resistance shall be 100
megohms minimum.
3.3.1.6.2.1.3 On completion of high temperature operating test and
while still at the operating temperature, the insulation resistance shall
be 20 megohms minimum.
3.3.1.6.2.1.4 On completion of high temperature operating test and
within 1 hour of returning to ambient temperature, the insulation
resistance shall be 100 megohms minimum.
3.3.1.7 Running time. The maximum continuous running time of the
inverter shall be 90 minutes, followed by sufficient time for the unit
to cool to ambient temperature.
3.3.1.8 Start-stop life. The inverter shall be capable of withstanding
a minimum of 1000 start-stop operations during its life in addition to
the start-stop operations encountered during testing to this specification.
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