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| MIL-I-46576A(OS)
4.2.2 Examination. One hundred percent examination shall be performed for all critical defects.
Examination for major and minor defects shall be performed in accordance with the classification of defects.
Four power (4x) magnification may be used for inspection of such defects as burr and foreign matter. When
compliance with the applicable requirement is in doubt as a result of visual examination, the characteristic
shall be measured or gaged to determine acceptability. All nonconforming material shall be rejected.
4.2.2.1 Cartridge, Drawing 8594157, covering a detail of Drawing 8596170.
Characteristics
Defect
Method of Inspection
Critical
1
Mixed cartridges
Visual
2
Metal defective
Visual
Major
101
Foreign matter present
Visual
Minor
201
Case scratched, wrinkled, bulged, or dented
Visual
202
Varnish missing or inadequate
Visual
4.2.2.2 Assembly, Drawing 8596170, less all drawings except Drawings 8593012, 8594744, 8594745,
MS28775-009 and MS28775-214.
Critical
1
Firing pin protrusion
Gage
2
Shear pin not engaged in firing pin
Visual
3
Shear pin setscrew missing
Visual
Major
101
O-ring not lubricated
Visual
102
Burr
Visual
103
Foreign matter
Visual
Minor
None defined
4.2.2.3 Assembly, Drawing 8596170, less all drawings except Drawings 8593012, 8593013, 8594744,
8594745, MS28775-009, and MS28775-214.
Critical
1
Cartridge loose or missing
Visual/Manual
2
Cartridge retainer loose
Visual/Manual
3
Metering groove of cartridge retainer missing
Visual
4
Elongated hole of cartridge retainer missing
Visual
Major
5
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