Modules, Standard Electronic, Logic Converter, Analog to Digital, Key Code DBA

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Modules, Standard Electronic, Logic Converter, Analog to Digital, Key Code DBA

Modules, Standard Electronic, Logic Converter, Analog to Digital, Key Code DBA
Module Description
Module Function
Table I. Pin programming for voltage scales
Correlation Requirements
Figure 1. 12 BIT bipolar A/D converter
Figure 2. Timing diagram 1, dc convert mode
Figure 3. Timing diagram 2, ac convert mode
Figure 4. Timing diagram 3, continuous converter mode
Circuit Pin Configuration
Alternate Test Methods
Changes from Previous Issue
Table I. Module electrical requirements
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Figure 5. DBA module, 12 BIT analog-to-digital converter
Figure 6. Operating temperature and life test circuit
Figure 7. Component temperature test circuit
Figure 8. Vibration test circuit
Table IV. VOUT (low-loaded) test
Table IV. VOUT (low-loaded) test (cont)
Figure 9. VOUT (low-loaded) test circuit for table IV
Figure 9. VOUT (low-loaded) test circuit for table IV (cont)
Table V. Input breakdown current test
Figure 10. Input breakdown current test circuit for table V
Table VI. Isolation test
Figure 11. Isolation test circuit for table VI
Table VII. Input current (low-level and high-level) and output short circuit current test
Table VII. Input current (low-level and high-level) and output short circuit current test (Cont)
Table VII. Input current (low-level and high-level) and output short circuit current test (Cont)
Figure 12. Input current (low-level and high-level) and output short circuit current test circuit for table VII
Table VIII. Output voltage (input threshold conditions), low-level and high-level, test
Table VIII. Output voltage (input threshold conditions), low-level and high-level, test (cont)
Table VIII. Output voltage (input threshold conditions), low-level and high-level, test (cont)
Figure 13. Output voltage (input threshold conditions), low-level and high-level, test circuit for table VIII
Figure 13. Output voltage (input threshold conditions), low-level and high-level, test circuit for table VIII-Cont
Figure 14. Logic load circuit
Table IX. Power supply current test
Figure 15. Power supply current test circuit for table IX
Table X. Functional A/D conversion test
Table X. Functional A/D conversion test (cont)
Table X. Functional A/D conversion test (cont)
Figure 16. Functional A/D conversion test circuit for table X
Figure 16. Functional A/D conversion test circuit for table X (cont)
Table XI. Output transition time (tTLH and tTHL) test
Table XI. Output transition time (tTLH and tTHL) test (cont)
Table XII. Propagation delay time (tPLH and tPHL) test and Setup and hold time check
Table XII. Propagation delay time (tPLH and tPHL) test and Setup and hold time check (cont)
Figure 17. Output transition time, and propagation delay time and setup and hold time check test circuit
Figure 18. Output transition time, and propagation delay time and setup and hold time check test -waveforms
Figure 18. Output transition time, and propagation delay time and setup and hold time check test -waveforms (Cont)
Figure 19. Propagation delay time (tPLH and tPHL) test circuit waveforms for table XII
Figure 20. Propagation delay time (tPHL) test circuit waveforms for table XII
Table XIII. Power supply filter capacitance test
Figure 21. Power supply filter capacitance test circuit for table XIII
Table XIV. Power supply transient amplitude test
Figure 22. Power supply transient amplitude test circuit for table XIV
Figure 23. Power supply transient amplitude test circuit waveforms for table XIV
Table XV. Input capacitance test
Figure 24. Input capacitance test circuit for table XV
Standardization Document Improvement Proposal
Address

Modules, Standard Electronic, Logic Converter, Analog to Digital, Key Code DBA

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