Modules, Standard Electronic, Arithmetic Logic Unit, Digital, Key Code FBA

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Modules, Standard Electronic, Arithmetic Logic Unit, Digital, Key Code FBA

Modules, Standard Electronic, Arithmetic Logic Unit, Digital, Key Code FBA
Module Configuration Requirements
Figure 1. FBA module function diagram, arithmetic logic unit
Table I. Module electrical requirements
Table I. Module electrical requirements (Cont)
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Alternate Test Methods
Module Description
Table II. Mode select line operation
Paralleling of Outputs
Figure 2. Input to output relationship
Figure 3. 12-bit full look-ahead carry adder/subtractor interconnection diagram
Figure 4. Operating temperature and life test circuit
Figure 5. Component temperature test circuit
Figure 6. Vibration test circuit
Table III. VOUT (low-loaded) test
Figure 7. VOUT (low-loaded) test circuit for table III
Table IV. Input breakdown current test
Table IV. Input breakdown current test (Cont)
Figure 8. Input breakdown current test circuit for table IV
Table V. Input clamp diode voltage test
Table V. Input clamp diode voltage test (cont)
Figure 9. Input clamp diode voltage test circuit for table V
Table VI. Isolation test
Figure 10. Isolation test circuit for table VI
Table VII. Static Output voltage (low-level) test
Figure 11. Static Output voltage (low-level) test circuit for table VII
Figure 12. Logic load circuit
Table VIII. Static Output voltage (high-level) test
Figure 13. Static Output voltage (high-level) test circuit for table VIII
Table IX. Input current (low-level) test
Table IX. Input current (low-level) test (Cont)
Table X. Input current (high-level) test
Table X. Input current (high-level) test (cont)
Figure 14. Input current (low-level and high-level) test circuit for tables IX and X
Table XI. Output short circuit current test
Figure 15. Output short circuit current test circuit for table XI
Table XII. Power supply current test
Figure 16. Power supply current test circuit for table XII
Table XIII. Transition time (tTLH) test
Table XIII. Transition time (tTLH) test (cont)
Table XIV. Transition time (tTHL) test
Table XIV. Transition time (tTHL) test (cont)
Table XV. Propagation delay time (tPLH) test
Table XV. Propagation delay time (tPLH) test (Cont)
Table XV. Propagation delay time (tPLH) test (Cont)
Table XV. Propagation delay time (tPLH) test (Cont)
Table XV. Propagation delay time (tPLH) test (Cont)
Table XVI. Propagation delay time (tPHL) test
Table XVI. Propagation delay time (tPHL) test (Cont)
Table XVI. Propagation delay time (tPHL) test (Cont)
Table XVI. Propagation delay time (tPHL) test (Cont)
Table XVI. Propagation delay time (tPHL) test (Cont)
Figure 17. Transition time (tTLH and tTHL) and Propagation delay time (tPLH and tPHL) test circuit
Figure 18. Transition time (tTLH and tTHL) and Propagation delay time (tPLH and tPHL) test circuit waveforms
Table XVII. Output crosstalk (low-level) test
Tabel XVIII. Output crosstalk (high-level) test
Figure 19. Output crosstalk (low-level and high-level) test circuit for tables XVII and XVIII
Figure 20. Output crosstalk (low-level and high-level) test circuit waveforms for tables XVII and XVIII
Table XIX. Power supply transient amplitude test
Figure 21. Power supply transient amplitude test circuit for table XIX
Figure 22. Power supply transient amplitude test circuit waveforms for table XIX
Table XX. Power supply filter capacitance test
Table XXI. Input capacitance test
Table XXI. Input capacitance test (Cont)
Figure 23. Power supply filter capacitance and input capacitance test circuit for tables XX and XXI
Table XXII. Functional test
Table XXII. Functional test (cont)
Table XXII. Functional test (cont)
Address
Standardization Document Improvement Proposal

Modules, Standard Electronic, Arithmetic Logic Unit, Digital, Key Code FBA

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