Modules, Standard Electronic, Standard Serial Input, Digital, Key Code EQJ

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Modules, Standard Electronic, Standard Serial Input, Digital, Key Code EQJ

Modules, Standard Electronic, Standard Serial Input, Digital, Key Code EQJ
Failure Rate Requirements
Figure 1. EQJ module function diagram, standard serial input
Figure 1. EQJ module function diagram, standard serial input (cont)
Table I. Module electrical requirements
Table I. Module electrical requirements (Cont)
Table I. Module electrical requirements (Cont)
Table I. Module electrical requirements (Cont)
Table I. Module electrical requirements (Cont)
Table I. Module electrical requirements (Cont)
Quality Assurance Provisions
Packaging Requirements
Module Description
Module Function
Clocks and Strobes
Serial Line Interfaces
Pin Nomenclature
Figure 2. Broadcast (mode timing)
Figure 2. Broadcast (mode timing) (cont)
Figure 2. Broadcast (mode timing) (cont)
Figure 3. Control serial "L"
Figure 3. Control serial "L"
Figure 4. Control serial "H"
Figure 4. Control serial "H" (cont)
Figure 4. Control serial "H" (cont)
Figure 5. Control serial "H" inteface variables
Table II. Counter pin programming (SSI)
Table II. Counter pin programming (SSI) (cont)
Changes from Previous Issue
Figure 6. Operating temperature and life test circuit
Figure 7. Operating temperature and life test circuit waveforms
Figure 8. Component temperature test circuit
Figure 9. Vibration test circuit
Table III. Isolation test
Figure 10. Isolation test circuit for table III
Table IV. VOUT (low-loaded) test
Figure 11. VOUT (low-loaded) test circuit for table IV
Table V. Input breakdown current test
Table V. Input breakdown current test (cont)
Figure 12. Input breakdown current test circuit for table V
Table VI. Output short circuit current test
Figure 13. Output short circuit current test circuit for table VI
Figure 14. Output short circuit current test circuit waveforms for table VI
Table VII. Input clamp diode voltage test
Figure 15. Input clamp diode voltage test circuit for table VII
Table VIII. Functional test
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Table VIII. Functional test (cont)
Figure 16. Functional test circuit for table VIII
Figure 17. Functional test circuit waveform for table VIII
Table IX. Output voltage (low-level) test
Figure 18. Output voltage (low-level) test circuit for table IX
Figure 19. EQJ logic load circuit
Figure 19. EQJ logic load circuit (cont)
Table X. Output voltage (high-level) test
Figure 20. Output voltage (high-level) test circuit for table X
Figure 21. Output voltage (high-level) test circuit waveforms for table X
Table XI. Input current (high-level) test
Table XI. Input current (high-level) test (cont)
Figure 22. Input current (high-level) test circuit for table XI
Table XII. Input current (low-level) test
Figure 23. Input current (low-level) test circuit for table XII
Table XIII. Power supply current test
Figure 24. Power supply current test circuit for table XIII
Table XIV. Transition time (tTLH) test
Table XIV. Transition time (tTLH) test (cont)
Table XV. Transition time (tTLH) test
Table XV. Transition time (tTLH) test (cont)
Figure 25. Transition time (tTLH and tTHL) test circuit for table XIV and XV
Figure 26. Transition time (tTLH and tTHL) test circuit waveforms for table XIV and XV
Table XVI. Propagation delay time (tPLH and tPHL) test
Figure 27. Propagation delay time (tPLH and tPHL) test circuit for table XVI
Figure 28. Propagation delay time (tPLH and tPHL) test circuit waveforms for table XVI
Table XVII. Propagation delay time (end-of-count) and EOC spike test
Figure 29. Propagation delay time (end-of-count) and EOC spike test circuit for table XVII
Figure 30. Propagation delay time (end-of-count) and EOC spike test circuit waveforms for table XVII
Table XVIII. Propagation delay time (tPHL), minimum pulse width test
Figure 31. Propagation delay time (tPHL), minimum pulse width test circuit for table XVIII
Figure 32. Propagation delay time (tPHL), minimum pulse width test circuit waveforms for table XVIII
Table XIX. Propagation delay time (tPLH and tPHL) test
Figure 33. Propagation delay time (tPLH and tPHL) test circuit for table XIX
Figure 34. Propagation delay time (tPLH and tPHL) test circuit waveforms for table XIX
Table XX. Propagation delay time (tPLH and tPHL) and minimum pulse width check test
Figure 35. Propagation delay time (tPLH and tPHL) and minimum pulse width check test circuit for table XX
Figure 36. Propagation delay time (tPLH and tPHL) and minimum pulse width check test circuit for table XX
Table XXI. Propagation delay time (tPLH and tPHL) and pulse width test
Figure 37. Propagation delay time (tPLH and tPHL) and pulse width test circuit for table XXI
Figure 38. Propagation delay time (tPLH and tPHL) and pulse width test circuit waveforms for table XXI
Table XXII. Maximum operating frequency test
Figure 39. Maximum operating frequency test circuit for table XXII
Figure 40. Maximum operating frequency test circuit waveforms for table XXII
Table XXIII. Maximum operating frequency check and pulse width test
Figure 41. Maximum operating frequency check and pulse width test circuit for table XXIII
Figure 42. Maximum operating frequency check and pulse width test circuit waveforms for table XXIII
Table XXIV. Output crosstalk (low-level) test
Table XXV. Output crosstalk (high-level) test
Figure 43. Output crosstalk (low-level and high-level) test circuit for table XXIV and XXV
Figure 44. Output crosstalk (low-level and high-level) test circuit waveforms for table XXIV and XXV
Table XXVI. Power supply transient amplitude test
Table XXVIII. Input capacitance test
Figure 45. Power supply transient amplitude test circuit for table XXVI
Figure 46. Power supply transient amplitude test circuit waveforms for table XXVI
Figure 47. Power supply filter and input capacitance test circuit for tables XXVII and XXVIII
Standardization Document Improvement Proposal

Modules, Standard Electronic, Standard Serial Input, Digital, Key Code EQJ

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