Modules, Standard Electronic, Counter, Up/Down, Binary, Digital, Key Code BHA

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Modules, Standard Electronic, Counter, Up/Down, Binary, Digital, Key Code BHA

Modules, Standard Electronic, Counter, Up/Down, Binary, Digital, Key Code BHA
Failure Rate Requirements
Figure 1. BHA module function diagram, binary up/down counter
Table I. Module electrical requirements
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Alternate Test Methods
Module Description
Input to Output Relationship
Figure 2. Operating temperature and life test circuit
Figure 3. Component temperature test circuit
Figure 4. Vibration test circuit
Table III. Isolation test
Figure 5. Isolation test circuit for table III
Table IV. VOUT (low-loaded) test
Figure 6. VOUT (low-loaded) test circuit for table IV
Table V. Input breakdown current test
Figure 7. Input breakdown current test circuit for table V
Table VI. Output short circuit current
Figure 8. Output short circuit current test circuit for table VI
Table VII. Output leakage current test
Figure 9. Output leakage current test circuit for table VII
Table VIII. Input clamp diode voltage test
Figure 10. Input clamp diode voltage test circuit for table VIII
Table IX. Output voltage (low-level and high-level) test
Table IX. Output voltage (low-level and high-level) test (cont)
Table IX. Output voltage (low-level and high-level) test (cont)
Table X. Functional test
Table X. Functional test (cont)
Table X. Functional test (cont)
Table X. Functional test (cont)
Figure 11. Output voltage (low-level and high-level) and functional test circuit for tables IX and X
Figure 11. Output voltage (low-level and high-level) and functional test circuit for tables IX and X (cont)
Figure 12. Logic load circuit
Table XI. Input current (low-level and high-level) test
Table XI. Input current (low-level and high-level) test (cont)
Table XI. Input current (low-level and high-level) test (cont)
Figure 13. Input current (low-level and high-level) test circuit for table XI
Table XII. Power supply current (high-level and low-level) test
Figure 14. Power supply current (high-level and low-level) test circuit for table XII
Table XIII. Transition time (tTLH and tTHL) test
Table XIII. Transition time (tTLH and tTHL) test (Cont)
Table XIII. Transition time (tTLH and tTHL) test (Cont)
Table XIII. Transition time (tTLH and tTHL) test (Cont)
Table XIII. Transition time (tTLH and tTHL) test (Cont)
Table XIV. Propagation delay time (tPHL and tPLH) test
Table XIV. Propagation delay time (tPHL and tPLH) test (cont)
Table XV. Propagation delay time (tPLH and tPHL) test
Table XV. Propagation delay time (tPLH and tPHL) test (cont)
Table XV. Propagation delay time (tPLH and tPHL) test (cont)
Table XV. Propagation delay time (tPLH and tPHL) test (cont)
Table XV. Propagation delay time (tPLH and tPHL) test (cont)
Table XV. Propagation delay time (tPLH and tPHL) test (cont)
Table XV. Propagation delay time (tPLH and tPHL) test (cont)
Table XV. Propagation delay time (tPLH and tPHL) test (cont)
Figure 15. Transition time, Propagation delay time (tPHL and tPLH) and (tPLH and tPHL) test circuit
Figure 16. Transition time (tTLH and tTHL) and Propagation delay time (tPHL and tPLH) test circuit waveforms
Figure 17. Transition time (tTLH and tTHL) and Propagation delay time (tPLH and tPHL) test circuit waveforms
Table XVI. Propagation delay time (tPLH and tPHL) test and minimum clear pulse width check
Table XVI. Propagation delay time (tPLH and tPHL) test and minimum clear pulse width check (cont)
Table XVI. Propagation delay time (tPLH and tPHL) test and minimum clear pulse width check (cont)
Table XVI. Propagation delay time (tPLH and tPHL) test and minimum clear pulse width check (cont)
Table XVI. Propagation delay time (tPLH and tPHL) test and minimum clear pulse width check (cont)
Table XVI. Propagation delay time (tPLH and tPHL) test and minimum clear pulse width check (cont)
Table XVI. Propagation delay time (tPLH and tPHL) test and minimum clear pulse width check (cont)
Figure 18. Propagation delay time (tPLH and tPHL) test and minimum clear pulse width check test circuit
Figure 19. Propagation delay time (tPLH and tPHL) test circuit waveforms for table XVI
Figure 20. Propagation delay time and minimum clear pulse width check test circuit waveforms for table XVI
Table XVII. Maximum counting frequency check (minimum count pulse width check) test
Figure 21. Maximum counting frequency check (minimum count pulse width check) test circuit
Figure 22. Maximum counting frequency check (minimum count pulse width check) test circuit waveforms
Table XVIII. Setup time (data to load) and minimum load pulse width check test
Figure 23. Setup time (data to load) and minimum load pulse width check test circuit for table XVIII
Figure 24. Setup time (data to load) and minimum load pulse width check test circuit waveforms
Table XIX. Output crosstalk (high-level and low-level and duration) test
Table XIX. Output crosstalk (high-level and low-level and duration) test (Cont)
Table XIX. Output crosstalk (high-level and low-level and duration) test (Cont)
Table XIX. Output crosstalk (high-level and low-level and duration) test (Cont)
Table XIX. Output crosstalk (high-level and low-level and duration) test (Cont)
Figure 25. Output crosstalk (high-level and low-level and duration) test circuit for table XIX
Figure 26. Output crosstalk (high-level and low-level) test circuit waveforms for table XIX
Figure 27. Output crosstalk (duration) test circuit waveforms for table XIX
Table XX. Power supply transient amplitude test
Figure 28. Power supply transient amplitude test circuit for table XX
Figure 29. Power supply transient amplitude test circuit waveforms for table XX
Table XXI. Power supply filter capacitance test
Figure 30. Power supply filter capacitance test circuit for table XXI
Table XXII. Input capacitance test
Figure 31. Input capacitance test circuit for table XXII
Table XXIII. Borrow pulse width test
Figure 32. Borrow pulse width test circuit for table XXIII
Figure 33. Borrow pulse width test circuit waveforms for table XXIII
Table XXIV. Minimum load hold time test
Table XXIV. Minimum load hold time test (cont)
Figure 34. Minimum load hold time test circuit for table XXIV
Figure 35. Minimum load hold time test circuit waveforms for table XXIV
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Modules, Standard Electronic, Counter, Up/Down, Binary, Digital, Key Code BHA

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