Modules, Standard Electrical, Gate, Nand, Digital, Key Code RHF

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Modules, Standard Electrical, Gate, Nand, Digital, Key Code RHF

Modules, Standard Electrical, Gate, Nand, Digital, Key Code RHF
Failure Rate Requirements
Figure 1. RHF module function diagram, NAND gate
Table I. Module electrical requirements
Table I. Module electrical requirements (cont)
Qualification Testing
Table II. Input to output relationship
Changes from Previous Issue
Figure 2. Operating temperature and life test circuit
Figure 3. Component temperature test circuit
Figure 4. Vibration test circuit
Table III. Isolation test
Figure 5. Isolation test circuit for table III
Table IV. VOUT (low-loaded) test
Figure 6. VOUT (low-loaded) test circuit for table IV
Table V. Input breakdown current test
Table V. Input breakdown current test (cont)
Table V. Input breakdown current test (cont)
Figure 7. Input breakdown current test circuit for table V
Table VI. Output leakage current
Figure 8. Output leakage current test circuit for table VI
Table VII. Output short circuit current test
Figure 9. Output short circuit current test circuit for table VII
Table VIII. Input clamp diode voltage test
Table VIII. Input clamp diode voltage test (cont)
Figure 10. Input clamp diode voltage test circuit for table VIII
Table IX. Output voltage (low-level) test
Table X. Output voltage (high-level) test
Table X. Output voltage (high-level) test (cont)
Figure 11. Output voltage (low-level and high-level) test circuit for tables IX and X
Figure 12. RHF logic load circuit
Table XI. Input current (high-level) test
Table XI. Input current (high-level) test (cont)
Table XI. Input current (high-level) test (cont)
Figure 13. Input current (high-level) test circuit for table XI
Table XII. Input current (low-level) test
Table XII. Input current (low-level) test (cont)
Figure 14. Input current (low-level) test circuit for table XII
Table XIII. Ground pin continuity test
Figure 15. Ground pin continuity test circuit for table XIII
Table XIV. Power supply current (low-level outputs and high-level outputs) test
Figure 16. Power supply current (low-level outputs and high-level outputs) test circuit for table XIV
Table XV. Transition time (tTLH and tTHL) and propagation delay time (tPLH and tPHL) test
Table XV. Transition time (tTLH and tTHL) and propagation delay time (tPLH and tPHL) test (cont)
Table XV. Transition time (tTLH and tTHL) and propagation delay time (tPLH and tPHL) test (cont)
Table XV. Transition time (tTLH and tTHL) and propagation delay time (tPLH and tPHL) test (cont)
Table XV. Transition time (tTLH and tTHL) and propagation delay time (tPLH and tPHL) test (cont)
Table XV. Transition time (tTLH and tTHL) and propagation delay time (tPLH and tPHL) test (cont)
Figure 17. Transition time (tTLH and tTHL) and propagation delay time (tPLH and tPHL) test circuit for table XV
Figure 18. Transition time (tTLH and tTHL) and propagation delay time (tPLH and tPHL) test circuit waveforms
Table XVI. Output crosstalk (low-level and high-level) test
Table XVI. Output crosstalk (low-level and high-level) test (cont)
Figure 19. Output crosstalk (low-level and high-level) test circuit for table XVI
Figure 20. Output crosstalk (low-level and high-level) test circuit waveforms for table XVI
Table XVII. Power supply transient amplitude test
Table XIX. Input capacitance test
Table XIX. Input capacitance test (cont)
Figure 21. Power supply transient amplitude test circuit for table XVII
Figure 22. Power supply transient amplitude test circuit waveforms for table XVII
Figure 23. Power supply filter and input capacitance test circuit for tables XVIII and XIX
Address
Standardization Document Improvement Proposal

Modules, Standard Electrical, Gate, Nand, Digital, Key Code RHF

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