Modules, Standard Electronic,Switch, Crosspoinnt, Key Code LZN

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Modules, Standard Electronic,Switch, Crosspoinnt, Key Code LZN

Modules, Standard Electronic,Switch, Crosspoinnt, Key Code LZN
Failure Rate Requirements
Figure 1. LZN module function diagram, crosspoint switch
Figure 1. LZN module function diagram, crosspoint switch (cont)
Table I. Module electrical requirements
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Qualification Testing
Module Description
Changes from Previous Issue
Table II. Analog switch selection
Figure 2. Operating temperature, component temperature, and life test circuit
Figure 3. Operating temperature, component temperature, and life test circuit waveform
Figure 4. Vibration test circuit
Table III. Stress test
Figure 5. Stress test circuit for table III
Figure 6. Test circuit for tunning all analog switches to the OFF state (single power supply)
Figure 6. Test circuit for tunning all analog switches to the OFF state (single power supply) (cont)
Figure
Table V. Negative input clamp diode voltage test
Table VI. Positive input clamp diode voltage test
Figure 8. Negative and positive input clamp diode voltage test circuit for tables V and VI
Table VII. Continuity test
Figure 9. Power supply surrent test circuit for table VIII
Table IX. Input functional test
Table IX. Input functional test (cont)
Table IX. Input functional test (cont)
Figure 10. Input functional test circuit for table IX
Figure 10. Input functional test circuit for table IX (cont)
Table X. Output functional test
Figure 11. Output functional test circuit for table X
Figure 11. Output functional test circuit for table X (cont)
Table XI. Leakage current (input and output) test
Figure 12. Leakage current (input and output) test circuit for table XI
Table XII. RON (VDD-VSS = 4.5 V) check test
Table XII. RON (VDD-VSS = 4.5 V) check test (cont)
Table XII. RON (VDD-VSS = 4.5 V) check test (cont)
Figure 13. RON (VDD-VSS = 4.5 V) check test circuit for table XII
Figure 13. RON (VDD-VSS = 4.5 V) check test circuit for table XII (Cont)
Figure 14. Test circuit for turning all analog switches to the OFF state (dual power supplies)
Figure 14. Test circuit for turning all analog switches to the OFF state (dual power supplies) (Cont)
Table XIII. RON (variable input voltage) check test
Table XIII. RON (variable input voltage) check test (cont)
Figure 15. RON (variable input voltage) check test circuit for table XIII
Figure 15. RON (variable input voltage) check test circuit for table XIII (cont)
Table XIV. AC feedthrough check test
Figure 16. AC feedthrough check, large signal response, and output crosstalk check test circuit
Figure 16. AC feedthrough check, large signal response, and output crosstalk check test circuit (Cont)
Table XVII. Input crosstalk check test
Figure 17. Input crosstalk check test circuit for table XVII
Figure 17. Input crosstalk check test circuit for table XVII (cont)
Table XVIII. Control crosstalk (address, data-in, and strobe) test
Figure 18. Control crosstalk (address, data-in, and strobe) test circuit for table XVIII
Figure 19. Control crosstalk (address, data-in, and strobe) test circuit waveforms for table XVIII
Table XIX. Input current (high-level) test
Figure 20. Input current (high-level) test circuit for table XIX
Table XX. Input current (low-level) test
Figure 21. Input current (low-level) test circuit for table XX
Table XXI. Power supply filter capacitance test
Table XXII. Input and output capacitance (digital and switch) test
Table XXII. Input and output capacitance (digital and switch) test (cont)
Figure 22. Input and output capacitance (digital and switch) test circuit for table XXII
Table XXIII. Propagation delay time (address to output, tPHZ) test
Table XXIV. Propagation delay time (address to output, tPZH) test
Figure 23. Propagation delay time (address to output, tPHZ and tPZH) test circuit for tables XXIII and XXIV
Figure 24. Propagation delay time (address to output, tPHZ and tPZH) test circuit waveforms
Table XXV. Propagation delay time (strobe to output, tPHZ) test
Table XXV. Propagation delay time (strobe to output, tPHZ) test (Cont)
Table XXV. Propagation delay time (strobe to output, tPHZ) test (Cont)
Table XXV. Propagation delay time (strobe to output, tPHZ) test (Cont)
Table XXVI. Propagation delay time (strobe to output, tPZH) test
Table XXVI. Propagation delay time (strobe to output, tPZH) test (cont)
Table XXVI. Propagation delay time (strobe to output, tPZH) test (cont)
Table XXVI. Propagation delay time (strobe to output, tPZH) test (cont)
Figure 25. Propagation delay time (strobe to output, tPHZ and tPZH) test circuit for tables XXV and XXVI
Figure 26. Propagation delay time (strobe to output, tPHZ) test circuit waveforms for tables XXV
Figure 27. Propagation delay time (strobe to output, tPZH) test circuit waveforms for tables XXVI
Table XXVII. Propagation delay time (data-in to output, tPHZ) test
Table XXVIII. Propagation delay time (data-in to output, tPZH) test
Figure 28. Propagation delay time (data-in to output, tPHZ and tPZH) test circuit for tables XXVII and XXVIII
Figure 29. Propagation delay time (data-in to output, tPHZ and tPZH) test circuit waveforms
Address
Standardization Document Improvement Proposal

Modules, Standard Electronic,Switch, Crosspoinnt, Key Code LZN

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