Modules, Standard Electronic, Memory Array, 128K Dynamic Random Access Module, Key Code JEJ

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Modules, Standard Electronic, Memory Array, 128K Dynamic Random Access Module, Key Code JEJ

Modules, Standard Electronic, Memory Array, 128K Dynamic Random Access Module, Key Code JEJ
Applicable Documents
Failure Rate Requirements
Table I. Module electrical requirements
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Quality Assurance Provisions
Figure 1. JEJ functional block diagram
Figure 2. JEJ pin assignment
Alternate Test Methods
Figure 3. JEJ operating temperature and component temperature test circuit
Figure 4. JEJ vibration test circuit
Thermal Shock Test
Figure 5. JEJ life test circuit
Module Descriptions
Input Parameters
Input Parameters (cont)
Input Parameters (cont)
Input Parameters (cont)
Input Parameters (cont)
Output Parameters
Output Parameters (cont)
Class I and II Dynamic Parameters
Class I and II Dynamic Parameters (cont)
Module Function
Data Out Drivers
Memory Array Miscellaneous Strapped Signals
Description of I/O Pins
Description of I/O Pins (cont)
Description of I/O Pins (cont)
Description of I/O Pins (cont)
Functional Test Vectors
Table II. Isolation test
Isolation test tolerance table
Figure 6. Isolation test circuit for table II
Table III. Continuity test
Figure 7. Continuity test circuit for table III
Table IV. Power supply stress test
Figure 8. Vcc stress test circuit for table IV
Table V. Input breakdown current test
Table V. Input breakdown current test (cont)
Table V. Input breakdown current test (cont)
Input breakdown current test tolerance table
Procedure required to perform the test
Table VI. Output short circuit current test
Table VI. Output short circuit current test (cont)
Output short circuit current test tolerance table
Procedure required to perform the test
Table VII. Input current, high level, test
Table VII. Input current, high level, test (cont)
Table VII. Input current, high level, test (cont)
Input current, high level, test tolerance table
Procedure required to perform the test
Table VIII. Input current, low level, test
Table VIII. Input current, low level, test (cont)
Table VIII. Input current, low level, test (cont)
Input current, low level, test tolerance table
Procedure required to perform the test
Table IX. Output voltage, high level, test
Table IX. Output voltage, high level, test (cont)
Output voltage, high level, test tolerance table
Procedure required to perform the test
Figure 9. Logic load circuit
Value of R2 for each output load
Table X. Output voltage, low level, test
Table X. Output voltage, low level, test (Cont)
Output voltage, low level, test tolerance table
Procedure required to perform the test
Table XI. Output leakage current, high and low level, test
Output leakage current, high and low level, test tolerance table
Procedure required to perform the test
Table XII. Input clamp diode voltage test
Table XII. Input clamp diode voltage test (cont)
Table XII. Input clamp diode voltage test (cont)
Input clamp diode voltage test tolerance table
Table XIII. Power supply filter capacitance test
Figure 10. Power supply filter capacitance test circuit for table XIII
Table XIV. Power supply current test
Table XV. Functional test
Procedure required to perform the test
Figure 11. Input timing parameters for table XV
Figure 11. Input timing parameters for table XV (cont)
Table XVI. Dynamic test
Procedure required to perform the test
Table XVI. Dynamic test (cont)
Table XVII. Dynamic parameters
Table XVII. Dynamic parameters (cont)
Figure 12a. Dynamic waveforms for table XVII
Figure 12b. Dynamic waveforms for table XVII
Table XVIII. Input and output capacitance test
Table XVIII. Input and output capacitance test (cont)
Table XVIII. Input and output capacitance test (cont)
Input and output capacitance test tolerance table
Figure 13. Input and output capacitance test circuit for table XVIII
Table XIX. Power supply transient amplitude test
Procedure required to perform the test
Figure 14. Power supply transient amplitude waveform for table XIX
Figure 15. Power supply transient amplitude test circuit for table XIX
Standardization Document Improvement Proposal

Modules, Standard Electronic, Memory Array, 128K Dynamic Random Access Module, Key Code JEJ

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