Modules, Standard Electronic Direct Memory Access II, Module, Key Code DWH

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Modules, Standard Electronic Direct Memory Access II, Module, Key Code DWH

Modules, Standard Electronic Direct Memory Access II, Module, Key Code DWH
Specification and standards
Performance requirements
Table 1. Module electrical requirements
Table 1. Module electrical requirements-cont.
Table 1. Module electrical requirements-cont.
Table 1. Module electrical requirements-cont.
Table 1. Module electrical requirements-cont.
Table 1. Module electrical requirements-cont.
End-of-life limits
Figure 1. DWH functional block diagram
Figure 2. DWH pin assignment
Operating temperature tests
Figure 3. DWH operating temperature component
Figure 4. DWH vibration test circuit
Life test
Figure 5. DWH life test circuit
Module description
Input parameters
Input parameters-cont.
Input parameters-cont.
Input parameters-cont.
Input parameters-cont.
Output parameters
Output parameters-cont.
Output parameters-cont.
Output parameters-cont.
Class I and II dynamic parameters
Class I and II dynamic parameters-cont.
Class I and II dynamic parameters-cont.
DMA write operations
DMA read/modify/write operations
Description of I/O pins
Description of I/O pins-cont.
Description of I/O pins-cont.
Description of I/O pins-cont.
Description of I/O pins-cont.
Functional test vectors
Table 2. Isolation test
Figure 6. Isolation test circuit for table 2
Table 3. Continuity test
Figure 7. Continuity test circuit for table 3
Table 4. Power supply stress test
Notes-cont.
Figure 8. Power supply stress test circuit for table 4
Table 4. Input breakdown current test
Input breakdown current test tolerance table
Notes-cont.
Table 6. Output short circuit current test
Table 6. Output short circuit current test-cont.
Table 6. Output short circuit current test-cont.
Output short circuit current test tolerance table
Output short circuit current test tolerance table-cont.
Table 7. Input current, high level, test
Table 7. Input current, high level, test-cont.
Input current, high level, test tolerance table
Input current, high level, test tolerance table-cont.
Table 8. Input current, low level, test
Table 8. Input current, low level, test-cont.
Input current, low level, test tolerance table
Input current, low level, test tolerance table-cont.
Table 9. Output voltage, high level, test
Table 9. Output voltage, high level, test-cont.
Output voltage, high level, test tolerance table
Notes-cont.
Figure 9. Logic load circuit
Notes-cont.
Table 10. Output voltage, low level, test
Table 10. Output voltage, low level, test-cont.
Table 10. Output voltage, low level, test-cont.
Table 10. Output voltage, low level, test-cont.
Output voltage, low level, test tolerance table
Notes-cont.
Table 11. Output leakage current, high and low level, test
Table 11. Output leakage current, high and low level, test-cont.
Output leakage current, high and low level, test tolerance table
Notes-cont.
Table 12. Input clamp diode voltage test
Input clamp diode voltage test tolerance table
Table 13. Power supply filter capacitance test
Figure 10. Power supply filter capacitance test circuit for table 13
Table 14. Power supply current test
Notes-cont.
Table 15. Functional test
Notes-cont.
Table 16. Dynamic test
Dynamic test tolerance table-cont.
Notes-cont.
Table 17. Dynamic parameters
Table 17. Dynamic parameters-cont.
Table 17. Dynamic parameters-cont.
Figure 11a. dynamic waveforms for table 17
Figure 11b. dynamic waveforms for table 17
Figure 11c. Dynamic waveforms for table 17
Table 18. Input and output capacitance test
Table 18. Input and output capacitance test-cont.
Table 18. Input and output capacitance test-cont.
Table 18. Input and output capacitance test-cont.
Input and output capacitance test tolerance table
Input and output capacitance test tolerance table-cont.
Figure 12. Input and output capacitance test circuit for table 18
Table 19. Input clamp diode latchup test
Notes-cont.
Table 20. Power supply transient amplitude test
Notes-cont.
Figure 13. Power supply transient amplitude waveform for table 20
Figure 14. Power supply transient amplitude test circuit for table 20
Standardization Document Improvement Proposal
Instructions

Modules, Standard Electronic Direct Memory Access II, Module, Key Code DWH

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