Microcircuits, CMOS, Analog Switch with Driver, Monolithic Silicon

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Microcircuits, CMOS, Analog Switch with Driver, Monolithic Silicon

Microcircuits, CMOS, Analog Switch with Driver, Monolithic Silicon
Power and thermal characteristics
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Switch operation
Figure 1. RDS(ON) versus VA and power supply voltage
Figure 2. RDS(ON) versus VA and temperature
Figure 3. Terminal connections
Figure 3. Terminal connections device types 03 and 07
Figure 4. Schematic circuit
Figure 4. Schematic circuit device type 03
Figure 4. Schematic circuit device type 04
Figure 4. Schematic circuit device type 05
Figure 4. Schematic circuit device type 07
Figure 4. Schematic circuit device type 08
Figure 5. RDS test circuits
Figure 9. ID(OFF) test circuit
Figure 11. input-output waveforms for time delay tests
Figure 11. input-output waveforms for time delay tests notes
Figure 14. Charge transfer error test circuit
Figure 15. Break-before-make test circuit
Figure 16. test circuits, burn-in and operating life test
Figure 16. test circuits, burn-in and operating life test device types 04 and 08
Figure 17. Test circuits, burn-in, dynamic and operating life test
Figure 17. Test circuits, burn-in, dynamic and operating life test device types 03, 04, 07, and 08
Figure 18. Test circuits, accelerated burn-in and life test
Figure 18. Test circuits, accelerated burn-in and life test device types 03, 04, 07, and 08
Figure 19. Test circuit (static and dynamic tests) for device types 01 and 05
Figure 20. Test circuit (static and dynamic tests) for device types 02 and 06
Figure 21. Test circuit (static and dynamic tests) for device types 03, 04, 07, and 08
Table 3. Group A inspection for device type 01
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 02
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 03
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 04
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 05
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 06
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 07
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 08
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Quality conformance inspection
Life test cooldown procedure
Table 5. Modes for high-voltage test
Ordering data
Substitutability-cont.

Microcircuits, CMOS, Analog Switch with Driver, Monolithic Silicon

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