Microcircuits, Linear, Hybrid, 12 BIT Analog-to-Digital Converters

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Microcircuits, Linear, Hybrid, 12 BIT Analog-to-Digital Converters

Microcircuits, Linear, Hybrid, 12 BIT Analog-to-Digital Converters
Absolute maximum ratings
Design, construction, and physical dimensions
Manufacturer eligibility
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Figure 1. Case outline X
Figure 2. Case outline Y
Figure 3. Terminal connections (all devices)
Figure 4. Functional schematic circuits
Figure 4. Functional schematic circuits-cont.
Figure 5. Block diagram
Figure 6. Timing diagram
Figure 8. Digital output codes
Figure 9. Test circuit for burn-in and steady state life test (all devices)
Figure 10. Test circuit for static tests for device types 01 through 16
Figure 10. Test circuit for static tests for device types 01 through 16-cont.
Figure 11. Timing diagram for serial to parallel check
Figure 12. Block diagram of A/D converter dynamic test circuit
Figure 13.Waveform of OUT clock input (pin 24) for dynamic test circuit
Figure 14. Block diagram of binary search and dither circuit
Figure 14. Reset waveforms for binary search and dither test circuit
Figure 15. Test circuit for propagation delay tests for device types 01 through 16
Figure 15. Test circuit for propagation delay tests for device types 01 through 16-cont.
Figure 16. Logic load test circuit for propagation delay tests
Figure 17. Optional test circuit for transition uncertainty test
Figure 17. Waveform for transition uncertainty test for device types 01 through 16
Qualification inspection
Table 3. Group A inspection for device types 01 through 16
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Table 3. Group A inspection for device types 01 through 16-cont.
Group C inspection
Data reporting
Abbreviations, symbols, and definitions
Logistic support
Part or Identifying Number (PIN)
Standardization Document Improvement Proposal

Microcircuits, Linear, Hybrid, 12 BIT Analog-to-Digital Converters

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