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Figure 9. Acquisition time test circuit and wavforms. |
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|  MIL-M-38510/125B
NOTES:
1. Acquisition time is equal to the logic sample pulse width which yields an output error from steady state
of 10 mV at the device under test (D.U.T.) output or 1 V at the differential amp output (for example;
pulse width t = taq when E1 E2 = 0.1 V).
2. Only the 0 V to +10 V step is shown. The other transitions as per figure 10 shall also be tested.
FIGURE 9. Acquisition time test circuit and wavforms.
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