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Figure 15. Alternate aperture time test waveforms. |
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|  MIL-M-38510/125B
NOTE:
1. The clock frequency and logic pulse width are adjusted so that there is a 300 nanosecond delay from
the logic hold transition to a 10 V input transition. For these conditions the effect on the output shall
be less than 1 mV. Laboratory instruments may be used to apply similar input conditions.
FIGURE 15. Alternate aperture time test waveforms.
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