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| MIL-M-38510/126C
TABLE I. Electrical performance characteristics Continued.
Conditions
Device
Limits
Test
Symbol
type
Units
VIN = 15 V dc, RT = 4.12 kΩ 0.01 %
Min
Max
RD = 0 kΩ, CT = 0.01 F 0.1 %
-55C ≤ TC ≤ +125C
unless otherwise specified
Soft start section
Error clamp voltage
03
0.4
V
VEC
A
Capacitor charging
03
-150
-50
ICS
current
Under voltage lockout section
Reset output (low)
03
0.4
V
VR (LO)
VREF = 3.8 V
voltage
Reset output (high)
03
2.4
V
VR (HI)
VREF = 4.8 V
voltage
Power consumption section
03
30
mA
Standby current
IIN
SHUTDOWN = 0.4 V, VIN = 35 V,
TC = -55C, +25C
25
SHUTDOWN = 0.4 V, VIN = 35 V,
TC = +125C
1/ Continuous short circuit limits will be less than indicated test limits.
2/ tOSC is the period of the output waveform.
3/ Each output transistor shall be tested for all parameters listed.
4/ This is a go-no-go test, the limit values are used for input voltages.
5/ Each output shall be tested for all parameters listed. VC = 20 V unless otherwise specified.
6/ A 2.7 kΩ pullup resistor is added from the Sync pin to VREF to limit the effects of stray capacitance in automatic
test equipment.
7/ Each output shall be tested for all parameters listed VC = 15 V unless otherwise specified.
8/ Only use the Shutdown pin, not the Sync pin, to deactivate the device.
3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in
table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 52
(see MIL-PRF-38535, appendix A).
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