Microcircuits, Monolithic Silicon Interface, Dual Peripheral Drivers

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Microcircuits, Monolithic Silicon Interface, Dual Peripheral Drivers

Microcircuits, Monolithic Silicon Interface, Dual Peripheral Drivers
Absolute maximum ratings-cont.
Power and thermal characteristics
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Schematic circuits
Figure 2. Truth tables
Figure 3. Functional schematic circuits
Figure 4. Test circuit, burn-in and operating life test
Figure 4. Test circuit, burn-in and operating life test device types 02, 03, 04, 05, 07, 08, 09, 10
Figure 5. Test circuit, burn-in (steady state power and reverse bias) and operating life test
Figure 5. Test circuit, burn-in (steady state power and reverse bias) and operating life test deviec types 02, 03, 04, 05, 07, 08, 09, 10
Figure 6. Accelerated burn-in and operating life test circuit
Figure 6. Accelerated burn-in and operating life test circuit device types 02, 03, 04, 05, 07, 08, 09, 10
Figure 7. Truth table for figure 6 burn-in test circuits
Figure 8. Test circuit for static tests, device types 01 and 06
Figure 9. hFE, VBE(sat) waveforms for table 3, device types 01 and 06
Figure 10. Test circuit for static tests, device types 02 through 05 and 07 through 10
Figure 11. Propagation delay time waveforms (TTL gates only), for device types 01 and 06
Figure 12. Switching time waveforms (TTL gates and transistors combined) for device types 01 and 06
Figure 13. Switching time for device types 01 and 06 (transistors only)
Figure 14. Switching time waveforms for device types 02 through 05 and 07 through 10
Table 3. Group A inspection for device type 01
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 02
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 03
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 04
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 05
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 06
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 07
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 08
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 09
Table 3. Group A inspection for device type 09-cont.
Table 3. Group A inspection for device type 09-cont.
Table 3. Group A inspection for device type 09-cont.
Table 3. Group A inspection for device type 09-cont.
Table 3. Group A inspection for device type 10
Table 3. Group A inspection for device type 10-cont.
Table 3. Group A inspection for device type 10-cont.
Table 3. Group A inspection for device type 10-cont.
Table 3. Group A inspection for device type 10-cont.
Quality conformance inspection
Life test and burn-in cooldown procedure
Abbreviations, symbols, and definitions
Logistic support
Instructions
Standardization Document Improvement Proposal

Microcircuits, Monolithic Silicon Interface, Dual Peripheral Drivers

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