Microcircuits, Linear, Monolithic and Hybrid Silicon, Microprocessor Compatible, 12 Bit Analog-to-Digital Converters

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Microcircuits, Linear, Monolithic and Hybrid Silicon, Microprocessor Compatible, 12 Bit Analog-to-Digital Converters

Microcircuits, Linear, Monolithic and Hybrid Silicon, Microprocessor Compatible, 12 Bit Analog-to-Digital Converters
Power and thermal characteristics.
Specifications, standards, and handbooks.
Lead material and finish.
Table 1. Electrical performance characteristics.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 2. Electrical test requirements.
Qualification extension.
Figure 1. Terminal connections.
Figure 2. Functional block diagram and operational information.
Figure 2. Functional block diagram and operational information-cont.
Figure 3. Functional block diagram.
Figure 4. Test circuit for static test.
Figure 5. Output test circuit for measuring the STS logic "1" voltage level.
Figure 6. Test circuit for dynamic test.
Figure 6. Test circuit for dynamic test-cont.
Figure 7. Test circuit for propagation delay.
Figure 8. Timing diagrams (system controlled operation).
Figure 8. Timing diagrams (system controlled operation)-cont.
Figure 9. Timing diagrams (stand alone operation).
Figure 9. Timing diagrams (stand alone operation)-cont.
Figure 10. Algorithm for measuring transition uncertainty.
Table 3. Group A inspection for all device types.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 3. Group A inspection for all device types-cont.
Table 4. Group C end point electrical parameters.
Abbreviations, symbols, and definitions.
Integral linearity error.
Logistic support.

Microcircuits, Linear, Monolithic and Hybrid Silicon, Microprocessor Compatible, 12 Bit Analog-to-Digital Converters

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