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TABLE III. Group A inspection for all device types Continued.
Applied voltages
Applied digital
DUT digital
Active
Measurement
Limits
Units
ref. pin 9
code-word
output
relays
sense lines
Equation and notes
(figures 6, 8)
code-word
ref. pin 9
Subgroup Symbol Test
Min
Max
29 <-------------> 40
29 <-------------> 16
7
11
1
Pin
Value
Unit
no.
VEE
VDD
VCC
MSB <------------>LSB
MSB <------------>LSB
(V)
(V)
(V)
V
1111 1110 000φ
4
KA
13
441
+15.0
-15.0
+5.0
1111 1110 0000
-.9
1.0
LSB
DLE26
DLE26 = (E613-E612) / S
"
1111 1111 000φ
"
"
442
"
"
"
1111 1111 0000
"
"
"
DLE27 = (E615-E614) / S
DLE27
"
1111 1111 100φ
"
"
443
"
"
"
1111 1111 1000
"
"
"
TA =
DLE28
DLE28 = (E617-E616) / S
"
+25C
1111 1111 110φ
"
"
444
"
"
"
1111 1111 1100
"
"
"
DLE29
DLE29 = (E619-E618) / S
"
1111 1111 111φ
"
"
445
"
"
"
1111 1111 1110
"
"
"
DLE30 = (E621-E620) / S
DLE30
446
+15.0
-15.0
+5.0
0000 0000 0000
0
Codes
MCC
VIN (analog) =
MCC = number of missing output codes from
Max (-) through
through
0000 0000 0000 to 1111 1111 1111.
Max(+)
1111 1111 1111
(Figures 4, 5), all device types
0000 0000 000φ
5
447
"
"
"
0000 0000 0000
13
E622
V
dVIO
dVIO / dT = 410* (E622-E556)
/ dT
Device types 01,02
-0.5
0.5
LSB
Device types 03, 04, 05, 06
-1.0
1.0
"
TA =
+125C
φφφφ φφφφ φφφφ
dBZ
448
"
"
"
0111 1111 1111
KA
"
E623
"
dBZ / dT = 410* (E623-E557)
/ dT
Device types 01, 03, 05
-1.0
1.0
LSB
Device types 02, 04, 06
-2.0
2.0
"
6
0000 0000 000φ
dAE
449
"
"
"
0000 0000 0000
"
E624
"
dAE / dT = 9.995*10 * ( 1 / (E624 E625)) -
1111 1111 111φ
/ dT
1111 1111 1110
"
E625
"
( 1 / (E559 E558))
ppm/C
Device types 01, 03, 05
-12.5
12.5
Device types 02, 04, 06
-25
25
"
6
0000 0000 000φ
dBPAE
450
"
"
"
0000 0000 0000
KA
"
E626
"
dBPAE / dT = 19.99*10 * ( 1 / (E627 E626)) -
1111 1111 111φ
/ dT
1111 1111 1110
"
"
E627
"
( 1 / (E561 E560))
ppm/C
Device types 01, 03, 05
-12.5
12.5
Device types 02, 04, 06
-25
25
"

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