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| TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be H > 2.0 V, or L < 0.8 V, or open).
MIL-
Case J, K, L, Z
13
14
15
16
17
18
19
20
21
22
23
24
Test limits
STD-883
Subgroup
Symbol
Meas.
Test No.
2D0
2Q0
2D1
2Q1
2D2
2Q2
2D3
2Q3
VCC
Min
Max
Unit
method
terminal
2 MR
2E 0
2E 1
1
3009
37 CKT A
GND
GND
0.4 V
5.5 V
2D2
-0.7
-2.4
mA
IIL1
"
"
37 CKT B
"
"
"
"
2D2
-0.7
-1.6
"
TC = 25C
"
"
"
37 CKT C
"
"
"
"
2D2
-0.5
-1.4
"
"
"
"
38 CKT A
"
"
0.4 V
"
2D3
-0.7
-2.4
"
"
"
"
38 CKT B
"
"
"
"
2D3
-0.7
-1.6
"
"
"
"
38 CKT C
"
"
"
"
2D3
-0.5
-1.4
"
IIL2
"
"
39
"
-0.7
-1.6
"
1 MR
"
40
"
"
"
"
""
"
1E 0
"
"
"
"
"
41
"
"
1E 1
"
"
"
42
0.4 V
"
"
"
"
2 MR
"
"
"
43
0.4 V
5.5 V
"
"
"
"
2E 0
"
"
"
44
5.5 V
0.4 V
"
"
"
"
2E 1
A
"
3010
45 CKT A
"
1D0
40
IIH1
"
"
"
45 CKT B, C
"
1D0
80
"
"
"
"
46 CKT A
"
1D1
40
"
"
"
"
46 CKT B, C
"
1D1
80
"
"
"
"
47 CKT A
"
1D2
40
"
"
"
"
47 CKT B, C
"
1D2
80
"
"
"
"
48 CKT A
"
1D3
40
"
"
"
"
48 CKT B, C
"
1D3
80
"
"
"
"
49 CKT A
5.5 V
2.4 V
"
2D0
40
"
"
"
"
49 CKT B, C
"
2.4 V
"
2D0
80
"
"
"
"
50 CKT A
"
2.4 V
"
2D1
40
"
"
"
"
50 CKT B, C
"
2.4 V
"
2D1
80
"
"
"
"
"
51 CKT A
"
2.4 V
"
2D2
40
"
"
"
51 CKT B, C
"
2.4 V
"
2D2
80
"
"
"
"
52 CKT A
"
2.4 V
"
2D3
40
"
"
"
"
52 CKT B, C
"
2.4 V
"
2D3
80
"
"
3010
53 CKT A
"
1D0
100
"
IIH2
"
"
"
53 CKT B, C
"
1D0
200
"
"
"
"
54 CKT A
"
1D1
100
"
"
"
"
54 CKT B, C
"
1D1
200
"
"
"
"
55 CKT A
"
1D2
100
"
"
"
"
55 CKT B, C
"
1D2
200
"
"
"
"
56 CKT A
"
1D3
100
"
"
"
"
56 CKT B, C
"
1D3
200
"
"
"
"
57 CKT A
5.5 V
5.5 V
"
2D0
100
"
"
"
"
57 CKT B, C
"
5.5 V
"
2D0
200
"
"
"
"
58 CKT A
"
5.5 V
"
2D1
100
"
"
"
"
58 CKT B, C
"
5.5 V
"
2D1
200
"
"
"
"
59 CKT A
"
5.5 V
"
2D2
100
"
"
"
"
59 CKT B, C
"
5.5 V
"
2D2
200
"
"
"
"
60 CKT A
"
5.5 V
"
2D3
100
"
"
"
"
60 CKT B, C
"
5.5 V
"
2D3
200
"
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