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Page Title:
Table 3. Group A inspection for device type 01. |
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|  TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0V or low ≤ 0.8 V or open).
Subgroup Symbol
MIL-
Case E & F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Meas.
Test limits
terminal
STD-883
Test No.
Clear
1Q
1D
2D
2Q
3D
3Q
GND
Clock
4Q
4D
5Q
5D
6D
6Q
VCC
Min Max Unit
method
1
VIC
1
-12mA
GND
4.5V
Clear
-1.5
V
TC = 25C
"
2
-12mA
"
"
1D
"
"
"
3
-12mA
"
"
2D
"
"
"
4
-12mA
"
"
3D
"
"
"
5
"
-12mA
"
Clock
"
"
"
6
"
-12mA
"
4D
"
"
"
7
"
-12mA
"
5D
"
"
"
8
"
-12mA
"
6D
"
"
VOH
3007
9
2.0V -.8mA
2.0V
"
B
"
1Q
2.4
"
"
"
10
"
2.0V
-.8mA
"
"
"
2Q
"
"
"
"
11
"
2.0V
-.8mA
"
"
"
3Q
"
"
"
"
12
"
"
"
-.8mA
2.0V
"
4Q
"
"
"
"
13
"
"
"
-.8mA
2.0V
"
5Q
"
"
"
"
14
"
"
"
2.0V
-.8mA
"
6Q
"
"
VOL
3008
15
0.8V 16mA
"
"
1Q
0.4
"
"
"
16
"
16mA
"
"
2Q
"
"
"
"
17
"
16mA
"
"
3Q
"
"
"
"
18
"
"
16mA
"
4Q
"
"
"
"
19
"
"
16mA
"
5Q
"
"
"
"
20
"
"
16mA
"
6Q
"
"
IIL1
3009
21 CKT A,C,D
"
0.4V
5.5V
Clock
-0.7
-1.6
mA
"
21 CKT B
"
0.4V
"
Clock
-0.3
-0.8
"
"
21 CKT E
"
0.4V
"
Clock
-0.4
-1.3
"
IIL2
"
22 CKT A,D,E 0.4V
"
"
Clear
-0.4
-1.3
"
IIL2
"
22 CKT B,C
0.4V
"
"
Clear
-0.7
-1.6
"
IIL3
"
23
0.4V
"
"
1D
-0.3
-0.8
"
"
"
24
0.4
"
"
2D
"
"
"
"
"
25
0.4V
"
"
3D
"
"
"
"
"
26
"
0.4V
"
4D
"
"
"
"
"
27
"
0.4V
"
5D
"
"
"
"
"
28
"
0.4V
"
6D
"
"
"
A
IIH1
3010
29
2.4V
"
"
Clear
40
"
"
30
2.4V
"
"
1D
"
"
"
"
31
2.4V
"
"
2D
"
"
"
"
32
2.4V
"
"
3D
"
"
"
"
33
"
2.4V
"
Clock
"
"
"
"
34
"
2.4V
"
4D
"
"
"
"
35
"
2.4V
"
5D
"
"
"
"
36
"
2.4V
"
6D
"
"
A
IIH2
3010
37
5.5V
"
"
Clear
100
"
"
38
5.5V
"
"
1D
"
"
"
"
39
5.5V
"
"
2D
"
"
"
"
40
5.5V
"
"
3D
"
"
"
"
41
"
5.5V
"
Clock
"
"
"
"
42
"
5.5V
"
4D
"
"
"
"
43
"
5.5V
"
5D
"
"
"
"
44
"
5.5V
"
6D
"
"
IOS
3011
45
5.5V
GND
5.5V
"
B
"
1Q
-20
-57
mA
"
"
46
"
5.5V
GND
"
"
"
2Q
"
"
"
"
"
47
"
5.5V
GND
"
"
"
3Q
"
"
"
"
"
48
"
"
"
GND
5.5V
"
4Q
"
"
"
"
"
49
"
"
"
GND
5.5V
"
5Q
"
"
"
"
"
50
"
"
"
5.5V
GND
"
6Q
"
"
"
ICC
3005
51
5.5V
5.5V
5.5V
5.5V
B
5.5V
5.5V
5.5V
"
VCC
65
"
See notes at end of device type 01.
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