Microcircuits, Linear, CMOS/ANALOG Multiplexers/Demultiplexers with overvoltage Protection, Monolithic Silicon, Positive Logic

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Microcircuits, Linear, CMOS/ANALOG Multiplexers/Demultiplexers with overvoltage Protection, Monolithic Silicon, Positive Logic

Microcircuits, Linear, CMOS/ANALOG Multiplexers/Demultiplexers with overvoltage Protection, Monolithic Silicon, Positive Logic
Recommended operating conditions
Correctness of indexing and marking
Quality conformance inspection
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 2. Electrical test requirements
Figure 1. Terminal connections
Figure 1. Terminal connections Device type 04 Case X
Figure 1. Terminal connections Device types 05 and 07 Case E
Figure 2. Functional diagrams
Figure 2. Functional diagrams Device types 03 and 04
Figure 2. Functional diagrams Device types 05 and 07
Figure 3. Truth tables
Figure 4. Case outline (28-lead, 9/16" x 1-7/16")
Figure 4. Case outline x (28-lead, 9/16" x 1-7/16")-cont.
Figure 5. Address and Enable input protection circuit for device types 02, 04, 05, and 06
Figure 6. Static burn-in test circuits
Figure 6. Static burn-in test circuits Device types 05 and 07
Figure 6. Static burn-in test circuits Device types 06 and 08
Figure 7. Dynamic and steady state life test circuits
Figure 7. Dynamic and steady state life test circuits Device types 05 and 07
Figure 7. Dynamic and steady state life test circuits Device types 06 and 08
Figure 8. Switching times test circuit and waveforms (Address inputs to I/0)
Figure 9. Switching times test circuit and waveforms (Enable to I/0)
Figure 10. Switching times test circuit and waveforms (Address inputs to I/0) Device types 03 and 04
Figure 11. Switching times test circuit and waveforms (Enable to I/0) Device types 03 and 04
Figure 12. Switching times test circuit and waveforms (Address inputs to I/0) Device types 05 and 07
Figure 10. Switching times test circuit and waveforms (Enable to I/0) Device types 05 and 07
Figure 14. Switching times test circuit and waveforms (Address inputs to I/0) Device types 06 and 08
Figure 15. Switching times test circuit and waveforms (Enable to I/0) Device types 06 and 08
Figure 16. Break befor make test circuit and waveforms
Figure 17. Single channel isolation test circuit
Figure 19. Charge transfer error test circuit
Table 3. Group A inspection for device type 01
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 02
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 03
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 04
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 05
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 06
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 07
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 08
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Group C inspection
Ordering data
Table 4. Group C end-point electrical parameters (TA = 25C)
Handling
Instructions
Standardization Document Improvement Proposal

Microcircuits, Linear, CMOS/ANALOG Multiplexers/Demultiplexers with overvoltage Protection, Monolithic Silicon, Positive Logic

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